AVS 47th International Symposium, Wednesday, 10/4/2000 Sessions

Wednesday October 4, 2000 Sessions

Click a title to see the papers

Room	WeM Wednesday, 10/4/00, 8:20am	WeA Wednesday, 10/4/00, 2:00pm
201	VT-WeM Sorption Processes and Leak Detection	VT-WeA Vacuum Gas Dynamics
202	BI+SS-WeM Water at Biointerfaces	BI-WeA Non-fouling Surfaces
203	TF-WeM Modeling of Thin Film Growth	TF+EL-WeA In-situ Characterization of Thin Film Growth
206	MI+EL-WeM Magnetic Semiconductors and Hybrid Structures I	MI+EL-WeA Magnetic Semiconductors and Hybrid Structures II
207	MC-WeM Methods of Data Analysis
208	SS1-WeM Chemical Interactions and Surface Reactivity	SS1+MC-WeA Oxide Surfaces, Interfaces and Defects
209	SS2-WeM Stimulated Surface Processes	SS2+VT-WeA Adsorption and Desorption Phenomena I
210	SS3-WeM Gas/Surface Dynamics	SS3-WeA Surface and Interface Structure I
302	NS+NANO6+MC-WeM Nanomechanical and Interface Measurements	NS+NANO6-WeA Nanoscale Modification of Materials
304	IE+PS+MS+SE-WeM Environmentally Friendly Process Development	MS-WeA Process Integration (Cu/Low-k/300mm)
306	SC+EL+SS-WeM Passivation and Etching of Semiconductors	SC+EL+SS-WeA Semiconductor Alloys
309	MM-WeM Microfabricated Sensors	MM-WeA MEMS Processing
310		PS1+MS-WeA Sensors and Control in Plasma Processing
311	PS+MS-WeM Plasma-Induced Damage	PS2-WeA Feature Evolution
312	DI+EL+MS-WeM Low K Dielectrics	DI+EL+MS-WeA Alternate Gate Dielectrics
313	OF+EL+SS-WeM Transport and Device Issues in Organic Thin Films	OF-WeA Self-Assembled Monolayers: Electron Transfer and Film Properties