| AVS 47th International Symposium | |
| Processing at the Nanoscale/NANO 6 | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | NS+NANO6+MC-WeM1 Surface Acoustic Wave Investigation by UHV Scanning Tunneling Microscopy P.U. Voigt, S. Krauß, E. Chilla, R. Koch, Paul-Drude-Institut für Festkörperelektronik, Germany |
| 8:40am | NS+NANO6+MC-WeM2 Q-Control: Characterizing Highly Sensitive Surface Structures with the AFM B. Anczykowski, NanoAnalytics WWU Münster, Germany, L.F. Chi, H. Fuchs, Physikalisches Institut WWU Münster, Germany |
| 9:00am | NS+NANO6+MC-WeM3 Invited Paper Traceability for Nanoscale Properties L.P. Howard, J. Pratt, National Institute of Standards and Technology |
| 9:40am | NS+NANO6+MC-WeM5 Low Temperature Scanning Force Microscopy of the Si(111) 7x7 Surface and Site-specific Measurements of Tip-Sample Interaction Forces M.A. Lantz, H.J. Hug, S. Martin, A. Abdurixit, A. Baratoff, R. Hoffmann, P. Kappenberger, P.J.A. van Schendel, University of Basel, Switzerland, Ch. Gerber, IBM Research Division, Zuerich Research Laboratory, H.-J. Guentherodt, University of Basel, Switzerland |
| 10:00am | NS+NANO6+MC-WeM6 Simultaneous STM/nc-AFM Imaging and Force Spectroscopy of Si(100)-(2x1) Surface with Small Oscillation Amplitudes H.O. Ozer, A. Oral, Bilkent University, Turkey, J.B. Pethica, University of Oxford, UK |
| 10:20am | NS+NANO6+MC-WeM7 A Liquid Helium Temperature Ultrahigh Vacuum Dual-tip Scanning Tunneling Microscope H. Okamoto, D. Chen, Rowland Institute for Science |