| AVS 47th International Symposium | |
| Material Characterization | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | MC-WeM1 Invited Paper Interpretation of the Shirley Background in XPS Analysis J.E. Castle, University of Surrey, U.K. |
| 9:00am | MC-WeM3 Formation of Potentially Protective Oxide-free Phosphate Films On Titanium Characterized by Valence Band X-ray Photoelectron Spectroscopy J.A. Rotole, Kansas State University, K. Gaskell, Nottingham Trent University, UK, A. Comte, Ecole Nationale Superieure de Chimie de Clemont-Ferrand, France, P.M.A. Sherwood, Kansas State University |
| 9:20am | MC-WeM4 Invited Paper Chemometric Approaches to the Analysis of Surface Chemical Image Data K.G. Lloyd, D.J. Walls, G.S. Blackman, N. Tassi, J.P. Wyre, E.I. DuPont de Nemours and Co., Inc. |
| 10:00am | MC-WeM6 Multivariate Analysis of TOF-SIMS Data of Dodecanethiol SAMs: Detailed Spectral Analysis and Insight Into Fragmentation D.J. Graham, B.D. Ratner, University of Washington |
| 10:20am | MC-WeM7 Z-dol PFPEs on Magnetic Recording Disks: A PLS Study of TOF-SIMS Spectra A. Spool, K. Kuboi, R. Waltman, P. Kasai, IBM Corporation |
| 10:40am | MC-WeM8 Exploration of the Time-of-Flight Secondary Ion Mass Spectra of Combinatorially Designed Polyarylates by using a Novel Multivariate Statistical Approach B.J. Tyler, Montana State University, A. Belu, Physical Electronics |