AVS 47th International Symposium
    Semiconductors Wednesday Sessions

Session SC+EL+SS-WeM
Passivation and Etching of Semiconductors

Wednesday, October 4, 2000, 8:20 am, Room 306
Moderator: Y.J. Chabal, Bell Laboratories, Lucent Technologies


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Click a paper to see the details. Presenters are shown in bold type.

8:20am SC+EL+SS-WeM1
Infrared Study of the Initial Stages of Etching of Si Electrode Surfaces in HF Solution
Y. Kimura, Y. Kondo, J. Nemoto, M. Niwano, Tohoku University, Japan
8:40am SC+EL+SS-WeM2
Electrical Transport at Chemically Modified Silicon Surfaces
O. Hul'ko, R. Boukherroub, C. Mark, S.N. Patitsas, H.Z. Yu, G.P. Lopinski, National Research Council Canada
9:00am SC+EL+SS-WeM3
Using Micromachined Test Patterns to Study Surface Chemistry: An Investigation of Etchant Anisotrophy
M.A. Hines, R.A. Wind, Cornell University
9:20am SC+EL+SS-WeM4
Etching of BPSG Films Using Anhydrous HF
A. Thorsness, G. Montano, A. Muscat, University of Arizona
9:40am SC+EL+SS-WeM5
Etching of Polymer-like a-Si:H Films by Impact of H
T. Zecho, B. Brandner, Universitaet Bayreuth, Germany, J. Biener, J. Kueppers, Max-Planck-Institut fuer Plasmaphysik (EURATOM Association), Germany
10:00am SC+EL+SS-WeM6
Reaction Mechanism of Si(100) Etching by Mass- and Energy-Selected Cl+ Beams
S.M. Lee, M. Lu, J.W. Rabalais, University of Houston
10:20am SC+EL+SS-WeM7
Deuterium Etching of the Si-rich SiC(0001)-(3x3) Surface Reconstruction
C.R. Stoldt, C. Carraro, R. Maboudian, University of California, Berkeley
10:40am SC+EL+SS-WeM8
Variable Temperature Study of Hydrogen and Deuterium Passivation of the Si(100)-2x1 Surface using the Scanning Tunneling Microscope
M.C. Hersam, N.P. Guisinger, K. Cheng, J. Lee, J.W. Lyding, University of Illinois