| Room |
WeM
Wednesday, 11/17/04, 8:20am |
WeL
Wednesday, 11/17/04, 12:00pm |
WeA
Wednesday, 11/17/04, 2:00pm |
| 210A |
AS-WeM
Chemometric Analysis of Spectral or Image Data; XPS/TOF-SIMS Applications |
|
AS+BI-WeA
Biological Applications of Surface Analysis |
| 210B |
SS1-WeM
Metal Oxides and Clusters I: Formation and Structure |
|
SS1-WeA
Metal Oxides and Clusters II: TiO@sub 2@ and Photocatalysis |
| 210C |
SS2-WeM
Semiconductor Surface and Interface Structure |
|
SS2-WeA
Surface Collision Dynamics |
| 210D |
BI1-WeM
Cell-Surface Interactions |
|
BI-WeA
"Passive" and Non-Fouling Surfaces |
| 213A |
PS1-WeM
Plasma in Nanoscale Applications |
|
PS-WeA
Plasma Diagnostics |
| 213B |
PS2-WeM
Plasma Sources |
|
SS+OF-WeA
Contacts to Molecules and Molecular Films |
| 213C |
BI2-WeM
Oligo Nucleotide - Surface Interactions |
|
|
| 213D |
NS-WeM
Nanoscale Patterning and Lithography |
|
NS-WeA
Nanotribology and Nanomechanics |
| 303B |
MS-WeM
Semiconductor Manufacturing Technologies for the 45nm Crisis |
|
MS+AS-WeA
Non-Destructive Analysis and Metrology for Advanced Manufacturing |
| 303C |
TF-WeM
Optical Thin Films |
|
TF-WeA
Transparent Conducting Oxides |
| 303D |
VT-WeM
Contamination Control, Outgassing and Modeling |
|
VT-WeA
Vacuum Measurement, Sensors and Control |
| 304A |
MI-WeM
Magnetic Nanostructures |
|
MI-WeA
Exchange Coupling, Surfaces, and Interfaces |
| 304B |
WL-WeM
Science of Semiconductor White Light I |
|
WL+MS-WeA
Science of Semiconductor White Light II |
| 304C |
OF+EM-WeM
Molecular and Organic Films and Devices - Electronics |
|
SC-WeA
Narrow Gap Semiconductors |
| Exhibit Hall B |
|
EW-WeL
Advances in SPM and Other Analytical Techniques |
|