AVS 51st International Symposium
    Exhibitor Workshop Wednesday Sessions

Session EW-WeL
Advances in SPM and Other Analytical Techniques

Wednesday, November 17, 2004, 12:00 pm, Room Exhibit Hall B
Moderator: M. Lagally, University of Wisconsin-Madison

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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

12:00pm EW-WeL1
Quantitative and Chemical State Analysis of Cross-Sectional GaAs/AlAs Superlattice Using the Newly Developed Scanning Auger Nanoprobe
M. Suzuki, N. Urushihara, N. Sanada, A. Yamamoto, H. Iwai, R. Oiwa, Y. Ohashi, ULVAC-PHI, Inc., Japan
12:20pm EW-WeL2
Ultimate Nanoprobing in UHV: Four Independent Scanning Tunneling Microscopes Navigated by High Resolution UHV SEM
M. Maier, J. Westermann, OMICRON NanoTechnology GmbH, Germany
12:40pm EW-WeL3
Advances in Nanoindentation and Application to Ultra-Thin DLC Films
J.M. Burkstrand, S. Downs, Hysitron, Inc., J.F. Moulder, Physical Electronics, USA
1:00pm EW-WeL4
Nano-structuring and Nano-manipulation with Scanning Probe Microscopy
S. Wu, Molecular Imaging
1:20pm EW-WeL5
Recent Developments in Scanning Probe Microscopy
M. Serry, Veeco Instruments