AVS 51st International Symposium
    Nanometer-scale Science and Technology Wednesday Sessions

Session NS-WeM
Nanoscale Patterning and Lithography

Wednesday, November 17, 2004, 8:20 am, Room 213D
Moderator: D.W. Carr, Sandia National Laboratories


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am NS-WeM1 Invited Paper
Massive Self-Assembly for Integrated Carbon Nanotube Circuits
S. Hong, Seoul National University, Korea
9:00am NS-WeM3
Surface-Programmed Assembly of Carbon Nanotubes on Silicon Oxide Surfaces for Integrated Circuit Applications
M. Lee, J. Im, S. Hong, Seoul National University, South Korea
9:20am NS-WeM4
Recent Lithography Results from the Digital E-Beam Array Lithography (DEAL) Concept
W.L. Gardner, L.R. Baylor, Oak Ridge National Laboratory, X. Yang, University of Tennessee, Knoxville, R.J. Kasica, D.K. Hensley, Oak Ridge National Laboratory, A.V. Melechko, Univeristy of Tennessee, Knoxville, D.C. Joy, P.D. Rack, B. Blalock, S. Islam, University of Tennessee, Knoxville, M.A. Guillorn, Cornell Nanofabrication Facility, M.L. Simpson, Oak Ridge National Laboratory
9:40am NS-WeM5
Monomer Based Thermally Curable Imprinting Lithography
H. Lee, Korea University, Korea
10:00am NS-WeM6
Charge Interactions in Ferroelectric Substrates: the Basis of Ferroelectric Nanolithography
D.B. Li, R. Shao, D.A. Bonnell, The University of Pennsylvania
10:20am NS-WeM7 Invited Paper
Nanoscale Patterning in Application to Novel Materials and Device Structures
N. Zhitenev, Bell Labs, Lucent Technologies
11:00am NS-WeM9
Fabrication of Nanopatterned Polymer Brushes by Scanning-Probe and Electron-Beam Lithography
W.K. Lee, M. Kaholek, S.J. Ahn, S. Zauscher, Duke University
11:20am NS-WeM10
Thermal Control in Dip Pen Nanolithography
P.E. Sheehan, Naval Research Laboratory, W.P. King, Georgia Tech, L.J. Whitman, Naval Research Laboratory
11:40am NS-WeM11
Chemomechanically Scribing Silicon with an AFM in a Read/Write Fashion
M.V. Lee, K. Gertsch, R.C. Davis, M.R. Linford, Brigham Young University