| AVS 51st International Symposium | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-WeM1 Angle-resolved X-ray Photoelectron Imaging of Heterogeneous Polymer Samples K. Artyushkova, J.E. Fulghum, The University of New Mexico |
| 8:40am | AS-WeM2 Detection of Small Chemical Changes on Liquid Crystal-Aligning Polymer Surfaces using Multivariate Data Analysis of XPS Spectra S. Pylypenko, K. Artyushkova, J.E. Fulghum, The University of New Mexico |
| 9:00am | AS-WeM3 Identifying Surface Chemical Changes with XPS Spectral Imaging and Multivariate Statistical Analysis@footnote 1@ D.E. Peebles, J.A. Ohlhausen, K.R. Zavadil, M.R. Keenan, P.G. Kotula, Sandia National Laboratories |
| 9:20am | AS-WeM4 Algorithm for Improved XPS-Imaging S. Tougaard, University of Southern Denmark |
| 9:40am | AS-WeM5 Invited Paper Chemometric Techniques for Two-way, Three-way and Higher-order Image Data J.M. Shaver, B.M. Wise, Eigenvector Research, Inc. |
| 10:20am | AS-WeM7 Maximum Likelihood Principal Component Analysis of ToF-SIMS Spectral Images M.R. Keenan, Sandia National Laboratories |
| 10:40am | AS-WeM8 AXSIA Analysis of TOF-SIMS Spectral and Image Series Data@footnote 1@ J.A. Ohlhausen, K.R. Zavadil, R.D. Kilgo, Sandia National Laboratories |
| 11:00am | AS-WeM9 ToF-SIMS as an Important Tool for Fuel Characterization: A Chemometrics Study G. Jiang, D. Stone, L. Baxter, Brigham Young University, B.J. Tyler, University of Utah, M.R. Linford, Brigham Young University |
| 11:20am | AS-WeM10 A Chemometrics Analysis of ToF-SIMS Spectra of Monolayers on Scribed Silicon L. Yang, Y.-Y. Lua, G. Jiang, M.R. Linford, Brigham Young University |