| Room |
WeM
Wednesday, 10/30/13, 8:00am |
WeL
Wednesday, 10/30/13, 12:00pm |
WeA
Wednesday, 10/30/13, 2:00pm |
| 101 A |
EN+SE+SS+TF-WeM
Thin Films for Energy |
|
EL+AS+EM+SS+TF-WeA
Spectroscopic Ellipsometry: Perspectives and Novel Applications |
| 101 B |
EM1-WeM
Electrical Testing and Defects in III-V’s |
|
EM-WeA
III-V Devices and Tunnel FETs |
| 102 A |
EM+PS-WeM
Oxides and Dielectrics for Novel Devices and Ultra-dense Memory II |
|
EM+AS+NS+SS-WeA
Semiconductor Heterostructures/Heusler Alloys |
| 102 B |
TC+EM+TF-WeM
Oxide and Flexible Electronics |
|
TC+EM+EN+TF-WeA
Transparent Conductors and Photovoltaics |
| 102 C |
TF+MI-WeM
Magnetic Thin Films and Nanostructures |
|
TF+AS+NS+SE-WeA
Beam and Glancing Angle Deposition (GLAD) Techniques |
| 104 A |
TF+VT-WeM
Thin Film Permeation Barriers and Encapsulation |
|
TF+AS+BI+EM+SE+SS-WeA
Applications of Self-Assembled Monolayers and Nano-Structured Assemblies |
| 104 B |
GR-WeM
2D Materials on Metallic Substrates |
|
GR+AS+EM+NS+SS-WeA
Dopants, Defects and Interfaces in 2D Materials |
| 104 C |
PS-WeM
Fundamentals of Plasma Surface Interactions |
|
PS-WeA
PSTD at AVS60: Looking Back and Moving Forward |
| 201 A |
SS+NS-WeM
Nanostructures: Reactivity & Catalysis |
|
SS+EM-WeA
Semiconductor Surfaces and Interfaces |
| 201 B |
BI-WeM
Cell-Surface Interactions |
|
BI+AI+AS+BA+IA+NL+NS+SP-WeA
Characterization of Biointerfaces |
| 202 A |
SS+AS-WeM
Catalysis in Prebiotic Chemistry (8:00-10:00 am)/Environmental Interfaces (10:40 am-12:00 pm) |
|
SS+AS+NS+SP-WeA
Single Molecules at Surfaces: Structure and Dynamics |
| 202 B |
MG+EM+MI+MS-WeM
Materials Discovery and Optimization through Iterative Approaches |
|
MG+EN+MS-WeA
Education for Interactive R&D & Industrial Implementation |
| 202 C |
VT-WeM
Pumps, Accelerators and Large Vacuum Systems |
|
VT+AS+SS+TF-WeA
Surface Science for Accelerator Applications |
| 203 A |
AP+AS+EM+MI+TF-WeM
APT Analysis of Semiconductor, Magnetic, and Oxide Materials |
|
AP+AS+MI+NS+SS-WeA
APT and FIM Analysis of Catalysts and Nanoscale Materials |
| 203 B |
NS+AS+BI+SP-WeM
Nanoscale Imaging and Microscopy |
|
NS+BI+EM-WeA
Nanopatterning and Nanolithography |
| 203 C |
SA+AS+MI+SS-WeM
Synchrotron and Imagery: PEEM, Nano-ARPES and Others (8:00-9:40 am)/Synchrotron TXRF and Related Techniques (10:40 am-12:00 pm) |
|
SE+PS-WeA
Atmospheric Pressure Plasmas |
| 204 |
AS+BI+IS-WeM
Ambient Ionization Mass Spectrometry |
|
AS-WeA
Developments in Electron Spectroscopies for Non-Ideal Samples 2 |
| Hall A |
EW-WeM
Exhibitor Technology Spotlight IV |
EW-WeL
Exhibitor Technology Spotlight V |
EW-WeA
Exhibitor Technology Spotlight VI |