| AVS 60th International Symposium and Exhibition | |
| Atom Probe Tomography Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AP+AS+EM+MI+TF-WeM1 Progress in Planar-Feature Spatial Reconstruction for Atom Probe Tomography D.J. Larson, B.P. Geiser, T.J. Prosa, T.F. Kelly, CAMECA |
| 8:20am | AP+AS+EM+MI+TF-WeM2 Invited Paper APT Analysis of Superlattices, Nanowires, and Non-Planar Heterostructures L.J. Lauhon, Northwestern University |
| 9:00am | AP+AS+EM+MI+TF-WeM4 Invited Paper Atom Probe Analyses of Interfaces in Nd-Fe-B Permanent Magnets for Higher Coercivity T. Ohkubo, H. Sepehri-Amin, K. Hono, National Institute for Materials Science, Japan |
| 10:40am | AP+AS+EM+MI+TF-WeM9 New Insights Into the Corrosion Behavior of Simulated Vitrified Nuclear Waste from Atom Probe Tomography D.K. Schreiber, J.V. Ryan, J.J. Neeway, Pacific Northwest National Laboratory, S. Gin, CEA Marcoule, France |
| 11:00am | AP+AS+EM+MI+TF-WeM10 Advanced Applications in LEAP Microscopy H.G. Francois-Saint-Cyr, R. Ulfig, CAMECA Instruments, Inc., J. Valley, T. Ushikubo, University of Wisconsin, Madison, M. Miller, Oak Ridge National Laboratory, H. Takamizawa, Y. Shimizu, Tohoku University, Japan, L. Gordon, D. Joester, Northwestern University, A. Giddings, D. Reinhard, D. Lawrence, P. Clifton, D. Larson, CAMECA Instruments, Inc. |
| 11:20am | AP+AS+EM+MI+TF-WeM11 Invited Paper Gaining an Atomic Scale Understanding of Optoelectronic, Magneto- and Ionic-Transport in Nanostructured Materials using Cross-Correlative STEM and APT B. Gorman, D. Diercks, R. Kirchhofer, Colorado School of Mines |