| AVS 60th International Symposium and Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | EL+AS+EM+SS+TF-WeA1 Optical Hall Effect - Detection of Symmetric and Anti-Symmetric Landau-Level Transitions in Multilayer Epitaxial Graphene on C-face SiC P. Kühne, Univ. of Nebraska-Lincoln, V. Darakchieva, Linköping Univ., Sweden, J.L. Tedesco, ABB, Inc, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, U.S. Naval Research Lab, C.M. Herzinger, J.A. Woollam Co., Inc., M. Schubert, T. Hofmann, Univ. of Nebraska-Lincoln |
| 2:20pm | EL+AS+EM+SS+TF-WeA2 A Physical Model Dielectric Function for Graphene from the THz to the UV A. Boosalis, University of Nebraska-Lincoln, W. Li, R. Elmquist, M. Real, N.V. Nguyen, National Institute of Standards and Technology (NIST), M. Schubert, University of Nebraska-Lincoln, R. Yakimova, V. Darakchieva, Linköping University, Sweden, R.L. Myers-Ward, C. Eddy, D.K. Gaskill, Naval Research Laboratory, T. Hofmann, University of Nebraska-Lincoln |
| 2:40pm | EL+AS+EM+SS+TF-WeA3 Invited Paper Spectroscopic Ellipsometry – A Perspective D.E. Aspnes, North Carolina State University |
| 4:00pm | EL+AS+EM+SS+TF-WeA7 The First Report of MetA-SIMS with Bismuth Over Layers M.R. Linford, N. Madaan, Brigham Young University |
| 4:20pm | EL+AS+EM+SS+TF-WeA8 Spectroscopic Ellipsometry of Thin Films for Archival Optical Data Storage and for Microfabricated Thin Layer Chromatography Plates M.R. Linford, A. Diwan, S. Kanyal, H. Wang, N. Madaan, Brigham Young University, A. Dadson, Diamond Analytics, R.C. Davis, B. Lunt, Brigham Young University, N. Podraza, The University of Toledo |
| 4:40pm | EL+AS+EM+SS+TF-WeA9 Invited Paper Optical Properties of Nanoscale Nanoelectronic Materials A.C. Diebold, College of Nanoscale Science and Engineering |
| 5:20pm | EL+AS+EM+SS+TF-WeA11 Optical Constants of Ni1-xPtx Silicides from Spectroscopic Ellipsometry L.S. Abdallah, S. Zollner, New Mexico State University, C. Lavoie, A. Ozcan, IBM, M. Raymond, GLOBALFOUNDRIES |
| 5:40pm | EL+AS+EM+SS+TF-WeA12 Anisoptropic Bruggeman Effective Medium Approaches for Slanted Columnar Thin Films D. Schmidt, E. Schubert, M. Schubert, University of Nebraska-Lincoln |