| AVS 60th International Symposium and Exhibition | |
| Synchrotron Analysis Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | SA+AS+MI+SS-WeM1 Invited Paper LEEM, PEEM and ARPES Studies of Epitaxial Graphene on SiC(0001) U. Starke, Max Planck Institute for Solid State Research, Germany |
| 8:40am | SA+AS+MI+SS-WeM3 An Imaging NEXAFS Detector for Compositional and Structural Analysis C. Weiland, Synchrotron Research, Inc., Z. Fu, C. Jaye, D. Fischer, National Institute of Standards and Technology (NIST), K. Scammon, University of Central Florida, P. Scobol, E. Principe, Synchrotron Research, Inc. |
| 9:00am | SA+AS+MI+SS-WeM4 Recent Advances in High Resolution Real and Reciprocal Space Photoelectron Emission Microscopy K. Winkler, B. Kroemker, Omicron NanoScience, Germany, N.J. Weber, M. Escher, FOCUS GmbH, Germany, N. Barrett, Cea Dsm Iramis Spcsi, France |
| 9:20am | SA+AS+MI+SS-WeM5 Quantum Material Spectroscopy Center at the Canadian Light Source S. Gorovikov, B. Yates, Canadian Light Source, A. Damascelli, H. Davis, University of British Columbia, Canada, R. Reininger, Advanced Photon Source, K.I. Blomqvist, Consultant, M. Sigrist, S. Chen, E. Hallin, Canadian Light Source |
| 9:40am | SA+AS+MI+SS-WeM6 Nano-ARPES Beamline at SOLEIL: A Powerful and Innovative Probe for Nanoscience M.C. Asensio, Synchrotron SOLEIL, France |
| 10:40am | SA+AS+MI+SS-WeM9 Invited Paper Grazing Incidence and Grazing Exit X-ray Spectroscopy of Ultra Shallow Arsenic Implants in Silicon F. Meirer, Utrecht University, Netherlands |
| 11:20am | SA+AS+MI+SS-WeM11 Basic Principles and Applications of Time Resolved Grazing Incidence EXAFS Experiments for Surface Studies in the 50 ms Range D. Lützenkirchen-Hecht, J. Stötzel, O. Müller, R. Frahm, Bergische Universität Wuppertal, Germany |
| 11:40am | SA+AS+MI+SS-WeM12 Portable versus Synchrotron TXRF Analysis J. Kawai, Y. Liu, S. Imashuku, Kyoto University, Japan |