AVS 60th International Symposium and Exhibition
    Applied Surface Science Wednesday Sessions

Session AS+BI+IS-WeM
Ambient Ionization Mass Spectrometry

Wednesday, October 30, 2013, 8:00 am, Room 204
Moderators: C. Szakal, National Institute of Standards and Technology, K. Artyushkova, University of New Mexico


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am AS+BI+IS-WeM2 Invited Paper
Rapid Evaporative Ionization Mass Spectrometry - Principles and Applications
Z. Takats, Imperial College, London, J. Balog, MediMass Ltd., Hungary
9:00am AS+BI+IS-WeM4
A Microplasma VUV Photoionization Source for Ambient Mass Spectrometry
J.M. Symonds, R.D. Gann, F. Fernández, T.M. Orlando, Georgia Institute of Technology
9:20am AS+BI+IS-WeM5
Advances in Pulsed-Plasma Sources for Surface Analysis by Ambient Mass Spectrometry
J.W. Bradley, K. McKay, A. Bowfield, University of Liverpool, UK, T.L. Salter, National Physical Laboratory, UK, J.W. Walsh, University of Liverpool, UK, M.R. Alexander, D.A. Barrett, University of Nottingham, UK, I.S. Gilmore, National Physical Laboratory, UK
9:40am AS+BI+IS-WeM6
Comparison of Ambient Pressure Ionization Sources by Determining Useful Yields of Forensic Compounds of Interest
T. Brewer, C. Szakal, E. Sisco, S. Muramoto, T. Forbes, G. Gillen, NIST
10:40am AS+BI+IS-WeM9 Invited Paper
Atmospheric Pressure Ionization Mass Spectrometry: Fundamentals, Simulations, and Applications
Th. Benter, University of Wuppertal, Germany
11:20am AS+BI+IS-WeM11
Ambient Mass Spectrometry for Structural Analysis of Organic Monolayers
H. Zuilhof, Wageningen University, Netherlands
11:40am AS+BI+IS-WeM12
Differentiation of Microbial Species & Strains in Coculture Biofilms by Multivariate Analysis of Laser Desorption Postionization Mass Spectra
C. Bhardwaj, Y. Cui, University of Illinois at Chicago, H.C. Bernstein, R.P. Carlson, Montana State University, L. Hanley, University of Illinois at Chicago