| AVS 60th International Symposium and Exhibition | |
| Nanometer-scale Science and Technology | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | NS+AS+BI+SP-WeM1 Outcomes of and Materials for Two University-Level Courses on Atomic Force Microscopy N.A. Burnham, Worcester Polytechnic Institute |
| 8:20am | NS+AS+BI+SP-WeM2 Imaging Li and B in a Glass Sample with 100nm Lateral Resolution Using NanoSIMS Z. Zhu, Pacific Northwest National Laboratory, Y. Wang, University of Florida, J. Crum, Pacific Northwest National Laboratory, Z. Wang, Chinese Academy of Science |
| 8:40am | NS+AS+BI+SP-WeM3 Visualization of Subsurface Features in Soft Matrix using Atomic Force Microscopy Techniques K. Kimura, K. Kobayashi, H. Yamada, Kyoto University, Japan |
| 9:00am | NS+AS+BI+SP-WeM4 Nanoscale Characterization Using Resonance Enhanced Infrared Spectroscopy E. Dillon, M. Lo, C. Prater, K. Kjoller, Anasys Instruments, M. Belkin, F. Lu, University of Texas at Austin |
| 9:20am | NS+AS+BI+SP-WeM5 AFM-based Chemical and Mechanical Property Characterization of Low-k/Cu Interconnects M. Lo, Anasys Instruments, S.W. King, Intel Corporation, E. Dillon, Q. Hu, R. Shetty, C. Prater, Anasys Instruments |
| 9:40am | NS+AS+BI+SP-WeM6 Amino Acid Immobilization and Surface Diffusion of Copper E. Iski, University of Tulsa, A.J. Mannix, B.T. Kiraly, M.C. Hersam, Northwestern University, N.P. Guisinger, Argonne National Laboratory |
| 10:40am | NS+AS+BI+SP-WeM9 Invited Paper Catalytic Model Systems Studied by High-Resolution, Video-Rate Scanning Tunneling Microscopy F. Besenbacher, Aarhus University, Denmark, J. Kibsgaard, Stanford University |
| 11:20am | NS+AS+BI+SP-WeM11 Invited Paper Scanned Probe Based Nanofabrication on Silicon: Progress, Challenges and Technology Spin-Offs J.W. Lyding, University of Illinois at Urbana Champaign |