AVS 58th Annual International Symposium and Exhibition

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Applied Surface Science Division Sessions

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Start Time Session Code Session Title
Sunday 3:00pm BP-SuA Challenges in Biomaterials Analysis
Monday 8:20am AS-MoM Quantitative Surface Chemical Analysis and Technique Development - Part I
Monday 8:20am IS+AS+SS-MoM In Situ Studies of Catalysis and Gas-Solid Reactions
Monday 2:00pm AS-MoA Quantitative Surface Chemical Analysis and Technique Development - Part II
Monday 2:00pm IS+AS+SS-MoA In Situ Characterization of Solids: Film Growth, Defects, and Interfaces
Tuesday 8:00am AS-TuM Imaging and 3D Chemical Analysis
Tuesday 8:00am IS+AS+SS-TuM In Situ Studies of Organic and Soft Materials and Liquid-Solid Interfaces
Tuesday 2:00pm AS-TuA Imaging and 3D Chemical Analysis - Part II
Tuesday 2:00pm HI+AS-TuA Basics of Helium Ion Microscopy
Tuesday 2:00pm NS+AS-TuA Frontiers in Nanoscale Imaging and Characterization
Tuesday 6:00pm AS-TuP Applied Surface Science Poster Session
Tuesday 6:00pm IS-TuP In Situ Spectroscopy and Microscopy Focus Topic Poster Session
Wednesday 8:00am AS+BI+NS-WeM Advances in Scanning Probe Microscopy
Wednesday 8:00am HI+AS+BI+NS-WeM Nano- and Bio- Imaging with Helium Ion Microscopy
Wednesday 8:00am NT+AS+MI-WeM Applications of Neutron Scattering I
Wednesday 2:00pm AS-WeA Correlative Analysis - A Multi-technique Approach for Identification and Structure-Property Relationships
Wednesday 2:00pm BI+AS+NS+SS-WeA Functionalization and Characterization of Nanostructures
Wednesday 2:00pm NT+AS-WeA Applications of Neutron Scattering II
Thursday 8:00am AS-ThM Analysis of Insulators and Challenging Samples
Thursday 8:00am BI-ThM Biomedical Materials
Thursday 8:00am EL+AS+EM+MS+PS+TF-ThM Spectroscopic Ellipsometry of Biological Materials and Organic Films
Thursday 8:00am TC+AS+EM-ThM Transparent / Printable Electronics Part 1
Thursday 8:00am TR+AS+SS-ThM Atomic-scale Characterization of Tribological Interfaces
Thursday 2:00pm EL+AS+EM+MS+PS+TF-ThA Spectroscopic Ellipsometry for Photovoltaics, Metals and Oxide Thin Films
Friday 8:20am EL+AS+EM+MS+PS+TF-FrM Spectroscopic Ellipsometry: Future Directions and New Techniques

AVS 58th Annual International Symposium and Exhibition