| AVS 58th Annual International Symposium and Exhibition | |
| Applied Surface Science Division | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-MoM1 Invited Paper Characterization of Nano-structures from Analysis of the XPS Background: Automation and 3D-imaging Sven Tougaard, University of Southern Denmark |
| 9:00am | AS-MoM3 Characterization of Model Gradient Inorganic Thin Films with XPS Spectral Modeling Lance Lohstreter, Medtronic, Inc, R. Sanderson, J. Dahn, Dalhousie University, Canada |
| 9:20am | AS-MoM4 Corrections for Backscattering Effects in Quantitative Auger Analyses A. Jablonski, Polish Academy of Sciences, Poland, Cedric Powell, National Institute of Standards and Technology |
| 9:40am | AS-MoM5 Effect of Monochromator X-ray Bragg Reflection on Photoelectric Cross Section Alberto Herrera-Gomez, CINVESTAV-Unidad Queretaro, Mexico |
| 10:00am | AS-MoM6 An XPS Investigation of CdS Based Photoresistor During Operation S. Suzer, Hikmet Sezen, Bilkent University, Turkey |
| 10:40am | AS-MoM8 Coronene Ion Bombardment Effects in the Quantitative Analysis of Polymeric Materials by XPS Gerry Hammer, L.J. Gamble, D.G. Castner, University of Washington |
| 11:00am | AS-MoM9 Using A C60 Ion Source For Routine Surface Chemical Analyses William Stickle, M.D. Johnson, D.K. Bilich, HP ADL Corvallis, C. Knutson, W. Wang, W. Cowell, Oregon State University |
| 11:20am | AS-MoM10 Large Area Quantitative XPS Imaging for Small Feature Compositional Screening Sarah Coultas, C.J. Blomfield, S.J. Hutton, A.J. Roberts, Kratos Analytical Ltd, UK, D.J. Surman, Kratos Analytical Inc. |
| 11:40am | AS-MoM11 A New Type of Detector for Dynamic XPS Measurements Konrad Winkler, P. Baumann, B. Kroemker, G. Pruemper, A. Feltz, Omicron NanoTechnology, Taunusstein, Germany |