AVS 58th Annual International Symposium and Exhibition, Session AS-WeA

AVS 58th Annual International Symposium and Exhibition
Applied Surface Science Division	Wednesday Sessions

Session AS-WeA
Correlative Analysis - A Multi-technique Approach for Identification and Structure-Property Relationships

Wednesday, November 2, 2011, 2:00 pm, Room 102
Moderator: Kateryna Artyushkova, The University of New Mexico

Click here to Download program book for this session
in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

2:00pm	AS-WeA1 Complementary Ultra Thin Film Analysis using Low Energy Ion Scattering (LEIS) and TOF-SIMS Thomas Grehl, P. Bruener, ION-TOF GmbH, Germany, N. Havercroft, ION-TOF USA, Inc., H. Brongersma, E. Niehuis, ION-TOF GmbH, Germany
2:20pm	AS-WeA2 Multi-technique Characterization of Polymer Surfaces and Diamond-Like Carbon Films Paul Mack, R.G. White, A.E. Wright, Thermo Fisher Scientific, UK
2:40pm	AS-WeA3 Invited Paper Challenges Associated with Mathematically Correlating Data from Multiple Surface Characterization Techniques Kathryn Lloyd, D.J. Walls, L. Zhang, J.P. Wyre, DuPont Corporate Center for Analytical Sciences
4:00pm	AS-WeA7 Multi-technique Characterization for Interfacial Analysis, Depth Profile and Chemical Imaging Satyanarayana Kuchibhatla, V. Shutthanandan, B.W. Arey, C.M. Wang, M.I. Nandasiri, N. Ponnusamy, T. Varga, S. Thevuthasan, Pacific Northwest National Laboratory, F. Liu, L. Huang, L. Porter, R.F. Davis, Carnegie Mellon University, T. Prosa, Cameca Instruments Inc.
4:20pm	AS-WeA8 Characterization of Lubricant Coated Cartridges Using Multiple Surface Analytical Techniques Xia Dong, Z. Xiao, C. Kemp, Eli Lilly and Company
4:40pm	AS-WeA9 Challenges in Surface and Interface Analysis of Thin Films Hong Piao, General Electric Co., Y.F. Hu, Canadian Light Source Inc., Canada, J. Fronheiser, General Electric Co., V. Tilak, General Electric Co., India, M. Karadge, M. Morra, General Electric Co.
5:00pm	AS-WeA10 A Comparison of AES and XPS Depth Profiling for Characterization of Multicomponent Thin Films Bridget R. Rogers, R.R. Harl, Vanderbilt University
5:20pm	AS-WeA11 Characterization and Fabrication of Patterned, Infiltrated Carbon Nanotube Forests with Applications to Thin Layer Chromatography Matthew R. Linford, D. Jensen, R. Davis, S. Kanyal, Brigham Young University, A. Dadson, M. Vail, US Synthetic Corporation