| AVS 58th Annual International Symposium and Exhibition | |
| Applied Surface Science Division | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS-TuM1 Invited Paper Recent Applications of GCIB Depth Profiling with XPS and TOF-SIMS Takuya Miyayama, N. Sanada, ULVAC-PHI Inc., Japan, J.S. Hammond, Physical Electronics |
| 9:00am | AS-TuM4 Advances in Organic Depth Profiling for Polymer Devices Joanna Lee, I.S. Gilmore, National Physical Laboratory, UK, A. Licciardello, University of Catania, Italy |
| 9:20am | AS-TuM5 TOF-SIMS Depth Profiling and 3D Analysis of Polymer Materials Using C60 and Ar Cluster Ion Beams for Sputtering Derk Rading, ION-TOF GmbH, Germany, N. Havercroft, ION-TOF USA, Inc., R. Moellers, E. Niehuis, ION-TOF GmbH, Germany |
| 9:40am | AS-TuM6 The zcorrectorgui for 3D ToF-SIMS Depth Profiles Daniel Graham, M. Robinson, D.G. Castner, University of Washington |
| 10:40am | AS-TuM9 3D Analysis of Organic Multilayer Structures by TOF-SIMS Using Ar Cluster Ions Rudolf Moellers, ION-TOF GmbH, Germany, R. Kersting, TASCON GmbH, Germany, D. Rading, E. Niehuis, ION-TOF GmbH, Germany |
| 11:00am | AS-TuM10 Molecular Imaging of Cells and Tissues with Novel Ion Beams Jiro Matsuo, QSEC, Kyoto University, CREST, Japan, K. Ichiki, T. Yamanobe, Y. Yamamoto, Kyoto University, Japan, S. Ibuki, QSEC, Kyoto University, CREST, Japan, T. Aoki, T. Seki, Kyoto Univeristy, CREST, Japan |
| 11:20am | AS-TuM11 High Resolution TOF-SIMS Imaging of Barrier Layers in Mouse Skin Stratum Corneum I. Ishizaki, ULVAC-PHI inc., Japan, A. Kubo, Keio University, Japan, Y. Ohashi, A. Yamamoto, ULVAC Inc., Japan, J.S. Hammond, G.L. Fisher, Scott Bryan, Physical Electronics |