| AVS 58th Annual International Symposium and Exhibition | |
| Helium Ion Microscopy Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:40am | HI+AS+BI+NS-WeM3 Invited Paper Helium Ion Microscopy Techniques for Imaging and Characterization of nano-Device Materials and Structures Shinichi Ogawa, T. Iijima, National Institute of Advanced Industrial Science and Technology (AIST), Japan |
| 9:20am | HI+AS+BI+NS-WeM5 He Ions Image the Au (111) Herringbone Reconstruction Vasilisa Veligura, G. Hlawacek, R. van Gastel, H. Zandvliet, B. Poelsema, MESA+ Institute for Nanotechnology, University of Twente, Enschede, The Netherlands |
| 9:40am | HI+AS+BI+NS-WeM6 Imaging of Graphenoid Nanomembranes with Helium-Ion Microscopy André Beyer, A. Turchanin, A. Gölzhäuser, University of Bielefeld, Germany |
| 10:40am | HI+AS+BI+NS-WeM9 Invited Paper Nanofabrication and Biological Imaging with the Helium Ion Microscope Daniel Pickard, National University of Singapore |
| 11:20am | HI+AS+BI+NS-WeM11 Imaging and Characterizing Cellular Interaction of Nanoparticles using Helium Ion Microscopy Bruce Arey, V. Shutthanandan, Y. Xie, A. Tolic, G. Orr, Pacific Northwest National Laboratory |
| 11:40am | HI+AS+BI+NS-WeM12 Application of Helium Ion Microscope on Semiconductor Surface Imaging and Metrology Hongxuan Guo, National Institute for Materials Science, Japan, H. Itoh, National Institute of Advanced Industrial Science and Technology (AIST), Japan, K. Onishi, T. Iwasaki, D. Fujita, National Institute for Materials Science, Japan |