AVS 58th Annual International Symposium and Exhibition, Session EL+AS+EM+MS+PS+TF-ThM

AVS 58th Annual International Symposium and Exhibition
Spectroscopic Ellipsometry Focus Topic	Thursday Sessions

Session EL+AS+EM+MS+PS+TF-ThM
Spectroscopic Ellipsometry of Biological Materials and Organic Films

Thursday, November 3, 2011, 8:00 am, Room 209
Moderators: Mariadriana Creatore, Eindhoven University of Technology, the Netherlands, Kathryn Lloyd, DuPont Corporate Center for Analytical Sciences

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in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

8:00am	EL+AS+EM+MS+PS+TF-ThM1 Invited Paper Application of Various Spectroscopic Ellipsometry Techniques for In Situ Studies of Thin Polymer Films on Solid Substrates Klaus-Jochen Eichhorn, Leibniz-Institut für Polymerforschung Dresden e.V., Germany
8:40am	EL+AS+EM+MS+PS+TF-ThM3 Hard Matter Meets Thin Polymer Films-Spectroscopic Ellipsometry as a Versatile Tool to Investigate Properties of Responsive Poly(N-isopropylacrylamide) Systems with Incorporated Magnetic Nanoparticles Sebastian Rauch, Leibniz-Institut für Polymerforschung Dresden e. V., Germany
9:00am	EL+AS+EM+MS+PS+TF-ThM4 The White Scarab Beetle Cyphochilus insulanus –Scattering and Polarization Properties Christina Akerlind, Swedish Defence Research Agency / Linköping University, Sweden, H. Arwin, Linköping University, Sweden, T. Hallberg, H. Kariis, Swedish Defence Research Agency, Sweden, J. Landin, K. Järrendahl, Linköping University, Sweden
9:20am	EL+AS+EM+MS+PS+TF-ThM5 Real-time Spectroscopic Ellipsometry and Quartz Crystal Microbalance with Dissipation Characterization of Biomolecule Adsorption within Sculptured Thin Films T. Kasputis, D. Schmidt, Keith Rodenhausen, H. Wang, A.K. Pannier, M. Schubert, University of Nebraska - Lincoln
9:40am	EL+AS+EM+MS+PS+TF-ThM6 Characterization of Multilayer Organic Thin Film for Use as an Aptamer Biosensor with Hybrid Spectroscopic Ellipsometry and Quartz Crystal Microbalance with Dissipation Jennifer Gerasimov, K.B. Rodenhausen, H. Wang, R.Y. Lai, M. Schubert, University of Nebraska - Lincoln
10:40am	EL+AS+EM+MS+PS+TF-ThM9 Contamination Processes of EUV Optics Characterized by Spectroscopic Ellipsometry Lee Richter, C. Tarrio, S. Grantham, S.B. Hill, T.B. Lucatorto, National Institute of Standards and Technology, N.S. Faradzhev, University of Virginia
11:00am	EL+AS+EM+MS+PS+TF-ThM10 Characterization of Organic Solar Cells Materials and Structures by Spectroscopic Ellipsometry J.P. Piel, L. Kitzinger, A. Bondaz, C. Defranoux, SEMILAB-SOPRALAB, France