| AVS 58th Annual International Symposium and Exhibition | |
| Applied Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS-ThM1 Imaging and Differentiation of Epicuticular Waxes on Arabidopsis thaliana Organs by TOF-SIMS Gregory Fisher, Physical Electronics, P. Wong, C. Buschhaus, R. Jetter, University of British Columbia, Canada |
| 8:20am | AS-ThM2 Aqueous SIMS – Towards in Situ Detection of Chemical Reaction Intermediates in Aqueous Solutions Zihua Zhu, L. Yang, X. Yu, M.J. Iedema, J.P. Cowin, Pacific Northwest National Laboratory |
| 8:40am | AS-ThM3 Challenges of the XPS Analysis of the Ionic Liquid [BMIM][PF6] Robert R. Harl, B.D. Booth, G.K. Jennings, B.R. Rogers, Vanderbilt University |
| 9:00am | AS-ThM4 Invited Paper Working with Difficult Samples - Preparation, Damage, Charging and Data Analysis Don Baer, M.H. Engelhard, A.S. Lea, P. Nachimuthu, Z. Zhu, Pacific Northwest National Laboratory |
| 10:40am | AS-ThM9 Transient Electron Emission from Insulators under Pulsed Electron Beam Injection Yoshinobu Kimura, H. Koyama, H. Makino, H. Shinada, Hitachi, Ltd., Japan, Y. Mochizuki, H. Kazumi, Hitachi High-Technologies Corp., Japan |
| 11:00am | AS-ThM10 High Resolution XPS Chemical State Imaging of Fuel Cell Membranes Sankar Raman, P.E. Larson, J. Moulder, J.S. Hammond, S. Alnabulsi, Physical Electronics USA |
| 11:20am | AS-ThM11 Gas-Cluster Ion Beam Secondary Ion Mass Spectrometry Characterization of Thin Films for Organic Electronics Applications Daniel J. Gaspar, Pacific Northwest National Laboratory, S.R. Bryan, Physical Electronics USA, T. Miyayama, ULVAC-PHI, Japan, A.B. Padmaperuma, J.S. Swensen, E. Polikarpov, Pacific Northwest National Laboratory |