| AVS 58th Annual International Symposium and Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | EL+AS+EM+MS+PS+TF-ThA1 Invited Paper Applications of Ellipsometry in Photovoltaics Dean Levi, National Renewable Energy Laboratory |
| 2:40pm | EL+AS+EM+MS+PS+TF-ThA3 Comparison between Ex Situ and Real Time Spectroscopic Ellipsometry Measurements of Structurally Graded Si:H Thin Films Nikolas Podraza, University of Toledo |
| 3:00pm | EL+AS+EM+MS+PS+TF-ThA4 Real-Time Spectroscopic Ellipsometry of Cu(In,Ga)Se2 Thin Film Deposition: Copper Transition in 3-Stage Co-Evaporation Process Dinesh Attygalle, University of Toledo, V. Ranjan, Old Dominion University, P. Aryal, University of Toledo, S. Marsillac, Old Dominion University, R.W. Collins, University of Toledo |
| 3:40pm | EL+AS+EM+MS+PS+TF-ThA6 Bulk Hetrojunction Solar Cell Characterization by Phase Modulated Spectroscopic Ellipsometry Kishore Uppireddi, L. Yan, HORIBA Scientific |
| 4:00pm | EL+AS+EM+MS+PS+TF-ThA7 In Situ Spectroscopic Ellipsometry during Atomic Layer Deposition of Pt, Pd and Ru Noemi Leick, J.W. Weber, M.J. Weber, A.J.M. Mackus, H.C.M. Knoops, W.M.M. Kessels, Eindhoven University of Technology, Netherlands |
| 4:20pm | EL+AS+EM+MS+PS+TF-ThA8 Manipulating the Optical Properties of Metals: Sculptured Thin Films Coated by Atomic Layer Deposition D. Schmidt, N. Ianno, E. Schubert, Mathias Schubert, University of Nebraska - Lincoln |
| 4:40pm | EL+AS+EM+MS+PS+TF-ThA9 Ellipsometric Characterisation of Porous Aluminium Oxide Supports W. Ogieglo, N.E. Benes, Herbert Wormeester, MESA+ Institute for Nanotechnology, University of Twente, Enschede, The Netherlands |
| 5:00pm | EL+AS+EM+MS+PS+TF-ThA10 Optical Properties and Structure of Vanadium Oxide Thin Films Michael Motyka, M.W. Horn, Pennsylvania State University, N.J. Podraza, University of Toledo |
| 5:20pm | EL+AS+EM+MS+PS+TF-ThA11 Sensitivity of Dielectric Properties of Vanadium Dioxide Thin Films to Growth Conditions D.W. Ferrara, Robert Marvel, J. Nag, R.F. Haglund, Vanderbilt University |