AVS 58th Annual International Symposium and Exhibition | |
Applied Surface Science Division | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
2:00pm | AS-TuA1 Integration of an External Cavity Quantum Cascade Laser Into a Scattering-Type Infrared Scanning Near-Field Optical Microscope Scott Lea, M.S. Taubman, M.C. Phillips, Pacific Northwest National Laboratory, M. Raschke, University of Colorado, Boulder |
2:20pm | AS-TuA2 An Investigation Into the Aging of Paintings using Surface Analysis Techniques Tim Nunney, Thermo Fisher Scientific, UK, J.J. Boon, AMOLF, Netherlands, E.S.B. Ferreira, Swiss Institute for Art Research (SIK-ISEA), Switzerland |
2:40pm | AS-TuA3 Probing Insect Tissue by NEXAFS Imaging: A Chemical Characterization of Cuticle from an African Flower Scarab (Eudicella gralli) Joe Baio, University of Washington, C. Jaye, National Institute of Standards and Technology, E. Sullivan, Woodland Park Zoo, D.A. Fischer, National Institute of Standards and Technology, D.G. Castner, T. Weidner, University of Washington |
3:00pm | AS-TuA4 Surface Cleaning of Organic and Inorganic Materials with Argon Cluster Ion Beams Andrew Wright, P. Mack, O. Greenwood, Thermo Fisher Scientific, UK |
4:00pm | AS-TuA7 Structure Determination of Heterogeneous Materials through 3D Imaging using XPS and Multivariate Analysis Kateryna Artyushkova, The University of New Mexico, S.J. Coultas, S.J. Hutton, A.J. Roberts, Kratos Analytical Inc. |
4:20pm | AS-TuA8 Interface Orientation Dependent Field Evaporation Behavior in Multilayer Thin Films Justin Brons, University of Alabama, A.A. Herzing, K.L. Henry, I.M. Anderson, National Institute of Standards and Technology, G.B. Thompson, University of Alabama |
4:40pm | AS-TuA9 Atom Probe Tomography and Spectroscopic Analysis of Wide Bandgap Nanostructures N. Dawahre, G. Shen, W. Baughman, S. Balci, S. Wilbert, N. Harris, L. Butler, S. Kim, Patrick Kung, University of Alabama |
5:00pm | AS-TuA10 Invited Paper Probing 3D-Semiconductor Structures Wilfried Vandervorst, IMEC, Belgium |