AVS 58th Annual International Symposium and Exhibition
    Applied Surface Science Division Tuesday Sessions

Session AS-TuA
Imaging and 3D Chemical Analysis - Part II

Tuesday, November 1, 2011, 2:00 pm, Room 102
Moderator: William Stickle, HP ADL Corvallis


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:00pm AS-TuA1
Integration of an External Cavity Quantum Cascade Laser Into a Scattering-Type Infrared Scanning Near-Field Optical Microscope
Scott Lea, M.S. Taubman, M.C. Phillips, Pacific Northwest National Laboratory, M. Raschke, University of Colorado, Boulder
2:20pm AS-TuA2
An Investigation Into the Aging of Paintings using Surface Analysis Techniques
Tim Nunney, Thermo Fisher Scientific, UK, J.J. Boon, AMOLF, Netherlands, E.S.B. Ferreira, Swiss Institute for Art Research (SIK-ISEA), Switzerland
2:40pm AS-TuA3
Probing Insect Tissue by NEXAFS Imaging: A Chemical Characterization of Cuticle from an African Flower Scarab (Eudicella gralli)
Joe Baio, University of Washington, C. Jaye, National Institute of Standards and Technology, E. Sullivan, Woodland Park Zoo, D.A. Fischer, National Institute of Standards and Technology, D.G. Castner, T. Weidner, University of Washington
3:00pm AS-TuA4
Surface Cleaning of Organic and Inorganic Materials with Argon Cluster Ion Beams
Andrew Wright, P. Mack, O. Greenwood, Thermo Fisher Scientific, UK
4:00pm AS-TuA7
Structure Determination of Heterogeneous Materials through 3D Imaging using XPS and Multivariate Analysis
Kateryna Artyushkova, The University of New Mexico, S.J. Coultas, S.J. Hutton, A.J. Roberts, Kratos Analytical Inc.
4:20pm AS-TuA8
Interface Orientation Dependent Field Evaporation Behavior in Multilayer Thin Films
Justin Brons, University of Alabama, A.A. Herzing, K.L. Henry, I.M. Anderson, National Institute of Standards and Technology, G.B. Thompson, University of Alabama
4:40pm AS-TuA9
Atom Probe Tomography and Spectroscopic Analysis of Wide Bandgap Nanostructures
N. Dawahre, G. Shen, W. Baughman, S. Balci, S. Wilbert, N. Harris, L. Butler, S. Kim, Patrick Kung, University of Alabama
5:00pm AS-TuA10 Invited Paper
Probing 3D-Semiconductor Structures
Wilfried Vandervorst, IMEC, Belgium