| AVS 58th Annual International Symposium and Exhibition | |
| In Situ Spectroscopy and Microscopy Focus Topic | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | IS+AS+SS-MoA1 Invited Paper A New Approach to Defect Evolution Studies – Combined In Situ Experiments and Electron Tomography Ian Robertson, J. Kacher, G. Liu, University of Illinois at Urbana-Champaign |
| 2:40pm | IS+AS+SS-MoA3 Invited Paper Real-time Oxide Growth Characterization using Atomic Force Microscopy Guus Rijnders, University of Twente, the Netherlands |
| 3:40pm | IS+AS+SS-MoA6 An Auger Electron Analyzer System for In Situ MBE Growth Monitoring William Calley, Georgia Institute of Technology, P.G. Staib, Staib Instruments, J.E. Lowder, J.D. Greenlee, M.W. Moseley, W.E. Henderson, W.A. Doolittle, Georgia Institute of Technology |
| 4:00pm | IS+AS+SS-MoA7 Quantum Size Effect Driven Structure Modifications of Bi-films on Ni(111) T.R.J. Bollmann, R. van Gastel, H. Zandvliet, Bene Poelsema, University of Twente, The Netherlands |
| 4:20pm | IS+AS+SS-MoA8 Growth and Structure of Sm on an Ultrathin Al2O3/Ni3Al(111) Film: A Comprehensive Study Junfa Zhu, Q. Xu, S. Hu, X. Feng, D. Chen, University of Science and Technology of China |
| 4:40pm | IS+AS+SS-MoA9 In Situ Study of the Reaction Mechanism Kinetics of Pt ALD from (MeCp)PtMe3 and O2 Ivo Erkens, A.J.M. Mackus, H.C.M. Knoops, F. Roozeboom, W.M.M. Kessels, Eindhoven University of Technology, Netherlands |
| 5:00pm | IS+AS+SS-MoA10 In Situ Surface Analytical Characterization of Electronic Devices: Thin Film Solar Cells and Lithium Ion Batteries as Examples Andreas Thissen, SPECS Surface Nano Analysis GmbH, Germany |