AVS 49th International Symposium
    Plasma Science Tuesday Sessions

Session PS-TuP
Plasma Applications

Tuesday, November 5, 2002, 5:30 pm, Room Exhibit Hall B2


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Click a paper to see the details. Presenters are shown in bold type.

PS-TuP1
Temperature Mapping in Fluorocarbon Plasmas using PLIF of CF
K.L. Steffens, National Institute of Standards and Technology
PS-TuP2
A Comparison of the Performance Between Low Pressure Magnetized and Non-magnetized Microwave Discharges
M. Perrin, T.A. Grotjohn, J. Asmussen, Michigan State University
PS-TuP3
Ion Attachment Mass Spectrometer(IAMS) for in situ and Fragment-free Monitoring of Plasma-CVD and Dry-etching Processes
Y. Hirano, M. Nakamura, Y. Shiokawa, T. Fujii, Anelva Corporation, Japan
PS-TuP4
Sub-Millimeter Absorption Spectroscopy of Fluorocarbon Plasmas
E.C. Benck, National Institute of Standards and Technology
PS-TuP5
Neutral Gas and Positive Ion Species of Ar/SF6 Inductive Plasma Discharges
R.R. White, M. Tuszewski, Los Alamos National Laboratory, A.M. Marakhtanov, University of California, Berkeley
PS-TuP6
Introduction of a Powerful New Method of Generating Accurate Endpoint Traces Combined with Process Fault Classification for Low Dimensional Open Areas
D. Knobloch, F.H. Bell, Infineon Technologies AG, Germany, K. Voigtlaender, J. Zimpel, ADP GmbH, Germany
PS-TuP7
Laser Thomson Scattering Diagnostics of Plasmas near Material Surfaces
K. Muraoka, K. Uchino, Y. Yamagata, Hassaballa Safwat, Kyushu University, Japan
PS-TuP8
Study of Process Variables and Plasma Parameters during Reactive Sputtering from a Titanium Hollow Cathode Source
A. Pradhan, S.I. Shah, University of Delaware
PS-TuP9
On the Limits of Operation of a Species-selective Gauge Based on the Penning Discharge Configuration@footnote 1@
C.C. Klepper, R.C. Hazelton, F. Barakat, J. Niemel, M.D. Keitz, HY-Tech Research Corporation, J.P. Verboncoeur, University of California, Berkeley
PS-TuP10
A Comparison of Techniques for Measuring Plasma-induced Damage
P. Sakthivel, A. Srivastava, M. Colson, M. Tun, Axcelis Technologies, Inc.
PS-TuP11
Electron Energy Distribution Function Measurement in Dual Frequency Very Narrow Gap Capacitively Coupled Plasma
B.I. Jeon, H.Y. Chang, Korea Advanced Institute of Science and Technology (KAIST)
PS-TuP12
Plasma Characteristics of Magnetically Confined Linearly Extended Inductively Coupled Plasma
B.K. Song, Y.J. Lee, C.H. Jeong, G.Y. Yeom, Sungkyunkwan University, Korea
PS-TuP13
Large Area Plasmas Processing System Based on Electron-Beam Ionization
D. Leonhardt, Naval Research Laboratory, S.G. Walton, D.D. Blackwell, SFA, Inc., R.F. Fernsler, R.A. Meger, Naval Research Laboratory
PS-TuP14
Large Area Surface Modification by Atmospheric Pressure Plasma for Cleaning and Adhesion
Y.H. Lee, C.H. Yi, SungKyunKwan University, Korea, E.S. Choi, LG-PRC, H.C. Woo, Korea Vacuum Tech., G.Y. Yeom, SungKyunKwan University, Korea
PS-TuP15
Microwave Power Coupling Principles for Generating Small Microwave Plasmas
S. Zuo, J.J. Narendra, A. Wijaya, D. Story, T.A. Grotjohn, J. Asmussen, Michigan State University
PS-TuP16
Simulation of a Micro-Plasma Reactor
D. Economou, S.K. Nam, University of Houston
PS-TuP17
Affecting Plasma Polymerised Film Properties by the Control of Ion Energy
D. Barton, R.D. Short, University of Sheffield, UK, J.W. Bradley, UMIST, UK
PS-TuP18
Study of Continuous Fluorocarbon Ion Deposition on Polystyrene Surfaces using Molecular Dynamic Simulations
I. Jang, S.B. Sinnott, University of Florida
PS-TuP19
Ion Energy Distributions at the Substrate and Feature Charging During Plasma Etching
A.E. Wendt, R. Silapunt, M. Patterson, R. Ding, Y.-H. Ting, University of Wisconsin - Madison
PS-TuP20
Energetic CF@sub 3@@super +@ and F@super +@ Bombardments of Si Surfaces using Molecular Dynamics Simulations
J.J. Seo, J.W. Kang, H.J. Hwang, Chung-Ang University, Korea
PS-TuP21
Simulations of Topography Defects Development (Undercut and Bowing) for Deep Silicon Etching under a SF@sub 6@/O@sub 2@ Plasma Chemistry
G. Marcos, University of Orleans, France, A. Rhallabi, University of Nantes, France, P. Ranson, University of Orleans, France
PS-TuP22
Ion Trajectories in Electron-shading Damage
T.G. Madziwa, F.F. Chen, D. Arnush, University of California, Los Angeles
PS-TuP23
LIF Measurement of Catalytic Species in Plasma Plume for Carbon Nanotubes Formation by PLA
T. Ikegami, M. Uchiyama, K. Ebihara, Kumamoto University, Japan, J. Asmussen, Michigan State University
PS-TuP24
Surface Investigation of Bone Tissue Treated with Non-thermal Plasmas
J.-C. Cigal, C.Y.M. Maurice, E. Wagenaars, L.J. van Ijzendoorn, A.H.F.M. Baede, R. Huiskes, G.M.W. Kroesen, Eindhoven University of Technology, The Netherlands
PS-TuP25
Surface Modification of Polymers in the Development of Anti-Microbial Coatings for Medical Devices
G.Sh. Malkov, E.R. Fisher, Colorado State University
PS-TuP26
Optimization of Four-component Gas He-Ne-Xe-Kr for High Efficiency Plasma Display Panel
T.W. Kim, S.U. Kwon, H.J. Hwang, Chung-Ang University, Korea
PS-TuP27
Bond Strength Improvement of Plasma Sprayed Hydroxyapateite/Titanium Composite Coatings on Titanium: Partial Nitriding of Titanium Deposits by RF Thermal Plasma
M. Inagaki, Y. Yokogawa, T. Kameyama, National Institute of Advanced Industrial Science and Technology (AIST), Japan
PS-TuP28
Reactive Sputtering in Hollow Cathodes
S.I. Shah, A. Pradhan, University of Delaware, S. Berg, T. Nyberg, Uppsala University, Sweden
PS-TuP29
Process-Induced Damage by the Low Angle Forward Reflected Neutral Beam Etching
D.H. Lee, M.J. Chung, H.K. Hwang, G.Y. Yeom, Sungkyunkwan University, Korea
PS-TuP30
Experimental Study on New Sterilization Process by using Plasma Source Ion Implantation Method with N@sub 2@ Gas
M. Yoshida, Mitsubishi Heavy Industries, Ltd., Japan, T. Tanaka, S. Watanabe, T. Takagi, Hiroshima Institute of Technology, Japan, M. Shinohara, Kurita Seisakusho Manufacturing Co., Ltd., Japan, S. Fujii, Adtec Plasma Technology Co., Ltd., Japan
PS-TuP31
Study on the Characteristics of Neutral Species in the Low Angle Forward Reflected Neutral Beam Etching System
M.J. Chung, D.H. Lee, N.G. Cho, G.Y. Yeom, Sungkyunkwan University, Korea
PS-TuP32
Improvement of Luminance and Luminous Efficiency through the Optimum Gas in AC Plasma Display Panel
S.J. Lee, H.-J. Hwang, Chung-Ang University, Korea
PS-TuP33
Surface Cleaning of Organic Materials on Metal by Atmospheric Pressure Plasma
C.H. Yi, Y.H. Lee, SungKyunKwan University, Korea, E.S. Choi, LG-PRC, H.C. Woo, Korea Vacuum Tech., G.Y. Yeom, SungKyunKwan University, Korea
PS-TuP34
A New Design in Atmospheric Plasma Generation Improves Versatility for Surface Treatment Applications in Industry
D. Chrysostomou, S. Goloviatinskii, TePla AG, Germany