| Room |
WeM
Wednesday, 11/1/17, 8:00am |
WeA
Wednesday, 11/1/17, 2:20pm |
| 10 |
SP+SS+TF-WeM
Probing and Manipulating Nanoscale Structure |
TR+AS+HI+NS+SS-WeA
Molecular Origins of Friction |
| 11 |
MI+SA-WeM
Controlling Magnetism in Oxides and Multiferroics and Chirality in Spin Transport and Magnetism (cont.) |
SE+2D+NS+SS+TF-WeA
Nanostructured Thin Films and Coatings |
| 12 |
BI+NS-WeM
Biomaterials and Nanomaterials Fabrication & In Honor of Dave Castner's 65th Birthday: Multitechnique Bio-Surface Characterization I |
BI+AS-WeA
In Honor of Dave Castner's 65th Birthday: Multitechnique Bio-Surface Characterization II |
| 13 |
AS+BI+MI+NS+SA+SS-WeM
Beyond Traditional Surface Analysis: Pushing the Limits |
AS+2D+NS+SA-WeA
2D, 3D and nD Imaging of Surfaces, Buried Interfaces and Nanostructures |
| 14 |
EM-WeM
Charge Transport in Disordered Materials |
EM+2D+MI+MN-WeA
Materials and Devices for Quantum Information Processing |
| 15 |
2D+EM+SS+TF-WeM
2D Materials Growth and Fabrication |
2D-WeA
Properties and Characterization of 2D Materials |
| 16 |
MN+2D-WeM
2D NEMS |
2D+EM+MN+NS-WeA
2D Device Physics and Applications |
| 18 |
|
|
| 19 |
NS+SS+SU-WeM
Nanotechnology for Renewable Energy |
NS+MN+MS+SS-WeA
Nanopatterning, Nanofabrication and 3D Nanomanufacturing |
| 20 |
TF-WeM
Thin Film for Photovoltaics |
VT-WeA
The History and Future of Materials, Surfaces and Interfaces (ALL INVITED SESSION) |
| 21 |
TF+EM+MI-WeM
Thin Films for Microelectronics |
|
| 22 |
PS+NS+SS-WeM
Plasma Processing for Nanomaterials & Nanoparticles |
PS+SS+TF-WeA
Plasma Deposition |
| 23 |
PS-WeM
Advanced BEOL/Interconnect Etching |
PS-WeA
Modeling of Plasmas |
| 24 |
HC+NS+SS-WeM
Nanoscale Surface Structures in Heterogeneously-Catalyzed Reactions |
HC+SA+SS-WeA
Bridging Gaps in Heterogeneously-Catalyzed Reactions |
| 25 |
SS-WeM
Deposition and Growth at Surfaces |
SS+HC+NS-WeA
Dynamical Processes at Surfaces |
| 5 & 6 |
SU+AS+EM+MS-WeM
Piezoelectrics, Thermoelectrics, and Superconductors |
MS+AS-WeA
Advanced Surface, Interface, and Structural Characterization for High Volume Manufacturing |
| 7 & 8 |
VT-WeM
Transfer and Ultraclean Systems, Particle Control, and History |
HI-WeA
Emerging Ion Sources and Optics |
| 9 |
SA+2D+AC+MI-WeM
Recent Advances of Diffracting/Scattering and Spectroscopic Methods for Correlated and 2D Materials |
SA+AS+HC+SS-WeA
In Situ and Operando Characterization of Interfacial Reactions in Energy & Electronic Devices |
| Ballroom B |
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| West Hall |
EW-WeM
Exhibitor Technology Spotlight Session |
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