AVS 64th International Symposium & Exhibition, Session AS+BI+MI+NS+SA+SS-WeM

AVS 64th International Symposium & Exhibition
Applied Surface Science Division	Wednesday Sessions

Session AS+BI+MI+NS+SA+SS-WeM
Beyond Traditional Surface Analysis: Pushing the Limits

Wednesday, November 1, 2017, 8:00 am, Room 13
Moderators: Svitlana Pylypenko, Colorado School of Mines, Paul Vlasak, The Dow Chemical Company

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in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

8:00am	AS+BI+MI+NS+SA+SS-WeM1 Photolysis of Pyruvic Acid in Aqueous Solution as a Source of Aqueous Secondary Organic Aerosol Yao Fu, X.F. Yu, F. Zhang, Z.H. Zhu, Pacific Northwest National Laboratory, J.M. Chen, Fudan University, X.Y. Yu, Pacific Northwest National Laboratory
8:20am	AS+BI+MI+NS+SA+SS-WeM2 XPS Depth Profiling of SrTiO₃ and HfO₂ with Small Argon Clusters Christopher Deeks, Thermo Fisher Scientific, UK, M. Baker, University of Surrey, UK, P. Mack, Thermo Fisher Scientific, UK
8:40am	AS+BI+MI+NS+SA+SS-WeM3 Invited Paper Surface Analysis of Intact Biomolecules: the Bigger They Are the Harder They Fly Nina Ogrinc Potocnik, R. Heeren, Maastricht University, The Netherlands
9:20am	AS+BI+MI+NS+SA+SS-WeM5 Hydrogen/Deuterium Exchange Using Vapor Phase D₂O to Enhance SIMS Characterizations Paul Vlasak, The Dow Chemical Company
9:40am	AS+BI+MI+NS+SA+SS-WeM6 Fragmentation and Backscattering of Large Ar_n⁺ Clusters as a Probe of Polymer Glass Transition C. Poleunis, Université Catholique de Louvain, Belgium, V. Cristaudo, Université Catholique de Louvain, Belguim, Arnaud Delcorte, Université Catholique de Louvain, Belgium
11:00am	AS+BI+MI+NS+SA+SS-WeM10 Invited Paper Evolution of the Bi Cluster LMIS as a Universal Source for High Performance SIMS Analysis Felix Kollmer, ION-TOF GmbH, Germany
11:40am	AS+BI+MI+NS+SA+SS-WeM12 Evaluating the Benefits of Cs Cluster Analysis in ToF-SIMS and Cs/Xe Co-sputtering for Depth Profiling Layered Thin Films James Ohlhausen, P.T. Vianco, M.T. Brumbach, R. Chow, Sandia National Laboratories
12:00pm	AS+BI+MI+NS+SA+SS-WeM13 Real-Time Monitoring Electrochemical Reaction Intermediates using In Situ Time-of-Flight Secondary Ion Mass Spectrometry Jun-Gang Wang, East China University of Science and Technology; Pacific Northwest National Laboratory (PNNL), Y. Zhang, X.Y. Yu, Z.H. Zhu, PNNL