AVS 64th International Symposium & Exhibition | |
Electronic Materials and Photonics Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
EM-ThP3 Electrolyte-Insulator-Semiconductor (EIS) device with Different Integrated Reference Electrodes for pH Detecting Rodrigo Reigota, J.A. Diniz, University of Campinas (UNICAMP), Brazil |
EM-ThP4 Optical and Magneto-optical Properties of Zn1-xCoxO / ZnO Hollow Nanospheres Da-Ren Liu, C.J. Weng, Instrument Technology Research Center, National Applied Research Laboratories |
EM-ThP5 Low-k Cryo-etching: Comparison of Four Different High Boiling Point Organic (HBPO) Romain Chanson, IMEC, Belgium, P.L. Lefaucheux, R. Dussart, T. Tillocher, GREMI, France, P. Shen, K. Urabe, C. Dussarat, Air Liquide, Japan, K. Maekawa, TEL Technology Center, America, LLC, K. Yatsuda, Tokyo Electron Limited, Japan, S. Tahara, Tokyo Electron Miyagi Limited, Japan, J.-F. de Marneffe, IMEC, Belgium |
EM-ThP6 Carrier Ion Exchange of Na2O-Fe2O3-P2O5-SiO2 Glass-Ceramics Yoshikazu Kaji, N. Yoshida, T. Okura, Kogakuin University, Japan |
EM-ThP7 Defect Doping ZnO Thin-Films with γ - Radiation Seth King, K.C. Slezak, University of Wisconsin - La Crosse, S.E. Chamberlin, Lawrence University, S.M. Lantvit, University of Wisconsin - La Crosse |
EM-ThP8 Design and Synthesis of Precursors for Photoassisted Chemical Vapor Deposition Christopher Brewer, O. Hawkins, University of Florida, B. Salazar, A.V. Walker, University of Texas at Dallas, L. McElwee-White, University of Florida |
EM-ThP9 Electrical and Mechanical Improvements with a Non-Thermal Curing Process for Porous SiCOH using Combined Ultraviolet and Vacuum-Ultraviolet Radiation Sang-heum Kim, J. Blatz, W. Li, H. Zhang, D. Pei, T. Guo, X. Zhou, University of Wisconsin-Madison, Y. Lin, H. Fung, C. Chen, National Synchrotron Radiation Research Center, Taiwan, Republic of China, S.W. King, Intel Corporation, Y. Nishi, Stanford University, J.L. Shohet, University of Wisconsin-Madison |
EM-ThP10 The Effects of Cesium Ion Implantation on the Mechanical and Electrical Properties of Porous SiCOH Low-k Dielectrics Weiyi Li, D.I. Benjamin, J. Chang, University of Wisconsin - Madison, Q. Lin, IBM Research Division, T.J. Watson Research Center, S.W. King, Intel Corporation, J.L. Shohet, University of Wisconsin - Madison |
EM-ThP11 The Effect of Proton Radiation on ALD HfO2 Films and HfO2 base RRAM Panpan Xue, University of Wisconsin-Madison, Z. Wang, Stanford University, T. Chang, University of Wisconsin-Madison, Y. Nishi, Stanford University, J.L. Shohet, University of Wisconsin-Madison |
EM-ThP12 Measurement of the Depth of Plasma Damage caused by VUV Photons and Oxygen Radicals using X-ray Reflectivity Ha Nguyen, F.A. Choudhury, University of Wisconsin-Madison, C. Lee, National Tsing Hua University, Taiwan, Republic of China, Y. Lin, H. Fung, C. Chen, National Synchrotron Radiation Research Center, Taiwan, Republic of China, J. Blatz, D.I. Benjamin, W. Li, J.L. Shohet, University of Wisconsin-Madison |
EM-ThP13 Oxygen Radical Transmission through and Damage to Freestanding Single and Multilayer Dielectric Films Faraz Choudhury, G. Sabat, M.R. Sussman, University of Wisconsin-Madison, Y. Nishi, Stanford University, J.L. Shohet, University of Wisconsin-Madison |
EM-ThP15 Effect of Proton Irradiation on Device Characteristics of Bottom Gate ZnO Thin Film Transistors with Sol-Gel Derived Channel Layers Kosala Yapabandara, V. Mirkhani, S. Wang, M.P. Khanal, S. Uprety, Auburn University, M.H. Sk, Qatar University, Qatar, A. Ahyi, T. Isaacs-Smith, M.C. Hamilton, M. Park, Auburn University |
EM-ThP16 Characterization of the Buried MgO/Al Interfaces in Multilayer Heterostructures used as Photocathodes with Hard X-ray Photoelectron Spectroscopy Jeff Terry, Illinois Institute of Technology |
EM-ThP17 Gamma-Ray Irradiation Effects on HfO2 RRAM Studied via EDMR Duane McCrory, P.M. Lenahan, Penn State University, D. Nminibapiel, D. Veksler, J.T. Ryan, J.P. Campbell, National Institute of Standards and Technology |
EM-ThP19 Defect Dependent Luminescence Dead Layers in CdS and CdSe Richard Rosenberg, Argonne National Laboratory |
EM-ThP20 High Breakdown Voltage (-201) β-Ga2O3 Schottky Rectifiers Jiancheng Yang, S.H. Ahn, F. Ren, S.J. Pearton, University of Florida |
EM-ThP21 Inelastic Electron Tunneling Spectroscopy and Electron Conduction Mechanisms of Porphyrin Molecular Junctions Teresa Esposito, P.H. Dinolfo, V. Meunier, K.M. Lewis, Rensselaer Polytechnic Institute |
EM-ThP22 Welding of Metal Nanowire Networks Using Eddy Current Method JiSoo Oh, D.I. Sung, D.S. Kim, K.H. Kim, G.Y. Yeom, Sungkyunkwan University, Republic of Korea |
EM-ThP23 Deep Ultraviolet Light Source with Carbon Nanotube based Electron Beam Pumping KyuChang Park, S.T. Yoo, Kyung Hee University, Republic of Korea |
EM-ThP24 An Unexpected Trend between Metal Work Function and Contact Resistance to Germanium Telluride Kayla Cooley, H. Simchi, H. Aldosari, J. O'Neil, S-Y. Yu, A. Molina, S.E. Mohney, The Pennsylvania State University |
EM-ThP25 RF Loss Improvement of GaN-HEMTs Grown on Silicon by Reduction of The Inversion Channel at Si Interface TienTung Luong, Y.H. Chen, J.Y. You, S. Chang, Y.T. Ho, Y.C. Lin, National Chiao Tung University, Taiwan, Taiwan, Republic of China, J.C.S. Woo, University of California, Los Angeles, E.Y. Chang, National Chiao Tung University, Taiwan, Taiwan, Republic of China |
EM-ThP26 The Photoelastic Coefficient P12 of H+ Implanted GaAs as a Function of Defect Density Andrey Baydin, H.T. Krzyzanowska, R. Gatamov, N.H. Tolk, Vanderbilt University |
EM-ThP27 Manipulation of Elliptical Polarization and Modulation of Optical Activity using Terahertz Stereo-metamaterial Reflectors Elizabath Philip, S. Pal, S.E. Stephens, P. Kung, S.M. Kim, The University of Alabama |