| AVS 59th Annual International Symposium and Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-TuP1 Sub-Micrometer Imaging of Lipids and Trace Elements in Various Cells with ToF-SIMS and Laser-SNMS H.F. Arlinghaus, F. Draude, S. Galla, A. Pelster, M. Körsgen, University of Muenster, Germany, J. Tentschert, H. Jungnickel, A. Haase, A. Luch, German Federal Institute of Risk Assessment, Germany, T. Schwerdtle, J. Müthing, University of Muenster, Germany |
| AS-TuP2 Comparative Study on the Methods to Determine the Interface Locations in SIMS Depth Profiling Analysis of Multilayer Films H.H. Hwang, University of Science and Technology (UST), Republic of Korea, J.S. Jang, H.J. Kang, Chungbuk National University (CBNU), Republic of Korea, K.J. Kim, University of Science and Technology (UST), Republic of Korea |
| AS-TuP3 Estimation of Useful Yield of Electrospray Droplet Impact/Secondary Ion Mass Spectrometry R. Takaishi, K. Hiraoka, University of Yamanashi, Japan |
| AS-TuP4 Multivariate Analysis Models to Predict Surface Chemistry or Performance using ToF-SIMS Mass Spectra Datasets N. Sano, M.-L. Abel, J.F. Watts, University of Surrey, UK |
| AS-TuP5 Method for Cross-sectional Analysis Using FIB, ToF-SIMS and Multivariate Analysis J.A. Ohlhausen, M.J. Rye, P.G. Kotula, J.R. Michael, T.J. Garino, Sandia National Laboratories |
| AS-TuP6 XPS Depth Analysis of Metal/Polymer Multilayer by Electrospray Droplet Impact Y. Sakai, R. Takaishi, S. Ninomiya, K. Hiraoka, University of Yamanashi, Japan |
| AS-TuP7 A Combined HAXPES and Electrical Characterisation Study of Si and III-V based MOS Structures L.A. Walsh, G.J. Hughes, Dublin City University, Ireland, P.K. Hurley, J.H. Lin, Tyndall National Laboratory, Ireland, J.C. Woicik, National Institute of Standards and Technology |
| AS-TuP9 The Development of Charged Particle Lenses for High Spatial Resolution XPS Studies R. Walker, Shimadzu Research Laboratory (Europe) LTD, UK |
| AS-TuP10 Image Depth Profiling for Three-Dimensional Characterisation of Microelectronic Structures B. Sgammato, A.E. Wright, A. Bushell, Thermo Fisher Scientific, UK |
| AS-TuP11 Developing a Methodology for XPS Profiling of Biofilms and Biological Materials R.G. White, Thermo Fisher Scientific, UK, D.Y. Petrovykh, International Iberian Nanotechnology Laboratory, Portugal, A.C. Areias, C. Sousa, G.P. Mendes, University of Minho, Portugal |
| AS-TuP12 XPS and Auger Analysis of Single and Multi-Layer Graphene Films: What is Graphene and What is Not? H.M. Meyer III, I. Vlassiouk, Oak Ridge National Laboratory, A.V. Sumant, Argonne National Laboratory |
| AS-TuP13 XPS Sputter Depth Profiling of Organic Thin Films Using an Ar Cluster Ion Source A.J. Roberts, S.J. Hutton, C.J. Blomfield, W. Boxford, Kratos Analytical Ltd., UK |
| AS-TuP14 Quantitative XPS Depth Profiling of Mobile Ions in Soda-Lime-Silica Glasses using a Polyatomic Ion Source C.J. Blomfield, S.J. Hutton, W. Boxford, Kratos Analytical Ltd., UK |
| AS-TuP15 XPS Assessment of the Thickness of Fe Oxide Layers using Standard and Active Shirley Background M. Bravo-Sanchez, CINVESTAV-Unidad Queretaro, Mexico, F. Espinosa-Magaña, CIMAV Unidad-Chihuahua, Mexico, A. Herrera-Gomez, UAM-Azcapotzalco and CINVESTAV-Queretaro, Mexico |
| AS-TuP16 Active Fitting for Optimized Shirley Background Determination J. Muñoz-Flores, UAM-Xochimilco, Mexico, A. Herrera-Gomez, UAM-Azcapotzalco and CINVESTAV-Queretaro, Mexico |
| AS-TuP18 Atom Probe Tomography Analysis of Grain Boundaries in CdTe V.S. Smentkowski, General Electric Global Research Center, D.J. Larson, D.A. Reinhard, T.J. Prosa, Cameca Instruments Inc., D. Olson, Cambridge University, UK, D. Lawrence, P.H. Clifton, R.M. Ulfig, T.F. Kelly, Cameca Instruments Inc. |
| AS-TuP19 Mapping of a Natural Lubricant Network on the Surface of Silicone Hydrogel Materials Using Surface and Bulk Chemistry Techniques K.A. Wygladacz, D.J. Hook, M. Merchea, E.P. Maziarz, Bausch + Lomb |
| AS-TuP20 Kinetics and Mechanism Studies of Copper Nano-Structures Formation on Functionalized Si Surfaces J.M. Lin, University of Delaware, K.A. Perrine, University of California, Irvine, A.V. Teplyakov, University of Delaware |
| AS-TuP21 Dry Cleaning Methods for Single Reconstructions of (100) InGaAs Following Air Exposure and Post Annealing Conditions W. Melitz, M. Edmonds, T.J. Kent, A.C. Kummel, University of California San Diego |
| AS-TuP22 The Effect of Gas Environment on the Electronic and Optical Properties of Amorphous Indium Zinc Tin Oxide Thin Films Y.R. Denny, S.Y. Lee, K.I. Lee, S.J. Seo, Chungbuk National University (CBNU), Republic of Korea, S. Heo, J.G. Chung, J.C. Lee, Samsung Advanced Institute of Technology, Republic of Korea, H.J. Kang, Chungbuk National University (CBNU), Republic of Korea |
| AS-TuP23 Modification of Metal – InGaAs Schottky Barrier Height by Atomic Layer Deposition of Ultrathin Al2O3 Interlayers L. Chauhan, Dublin City University, Ireland, S. Gupta, P. Jaiswal, N. Bhat, S.A. Shivashankar, Indian Institute of Science Bangalore, India, G.J. Hughes, Dublin City University, Ireland |
| AS-TuP26 STM Imaging and Manipulation of a Three-Metal-Center Organometallic Molecule N.A. Wasio, R.C. Quardokus, Y. Lu, S.A. Kandel, University of Notre Dame |
| AS-TuP27 Development of Advanced SIMS Single Stage Accelerator Mass Spectrometer Instrument at the Naval Research Laboratory K. Fazel, K. Grabowski, D. Knies, G. Hubler, Naval Research Laboratory |
| AS-TuP28 Catalytic Effect of Ni in the Gasification of Flexicoke with Water Steam J.C. De Jesus, I.J. Gonzalez, PDVSA Intevep, Venezuela (Bolivarian Republic of), E.A. Rendon, Universidad Central de Venezuela, (Bolivarian Republic of) |