AVS 59th Annual International Symposium and Exhibition
    Applied Surface Science Tuesday Sessions
       Session AS-TuP

Paper AS-TuP14
Quantitative XPS Depth Profiling of Mobile Ions in Soda-Lime-Silica Glasses using a Polyatomic Ion Source

Tuesday, October 30, 2012, 6:00 pm, Room Central Hall

Session: Applied Surface Science Poster Session
Presenter: C.J. Blomfield, Kratos Analytical Ltd., UK
Authors: C.J. Blomfield, Kratos Analytical Ltd., UK
S.J. Hutton, Kratos Analytical Ltd., UK
W. Boxford, Kratos Analytical Ltd., UK
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Soda-lime-silica glass is widely used not only for architectural and automotive applications but increasingly in electrical devices as display panels and in photovoltaic applications. The role of mobile ions such as alkali or alkaline-earth ions in these glasses can affect the quality in architectural glass but can have a large impact on electrical device performance. It is important to know the concentration of these mobile ions in the glass surface region and deeper into the glass substrate to understand the leaching process.

Alkali migration has been a noted artefact of sputtering with monatomic Ar ion beams and the use of polyatomic ion beams more commonly applied to organic materials has been shown to yield some benefits in reduced migration without incorporation of C into the glass matrix.

In this investigation we compare the results with monatomic Ar ion sputtering and polyatomic (Coronene) for a number of soda-lime-silica glass samples.