| AVS 52nd International Symposium | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-WeA1 Analysis of a Model System for Reactions of Organic Molecules on Atmospheric Particles: SAMS and Ozone D.J. Gaspar, Pacific Northwest National Laboratory, T.M. McIntire, University of California, Irvine, A.S. Lea, N. Jaitly, Pacific Northwest National Laboratory, Y. Dubowski, Technion-Israel Institute of Technology, B.J. Finlayson-Pitts, University of California, Irvine |
| 2:20pm | AS-WeA2 Formation and Volatilization of Small Molecules From a PTFE Matrix Upon MeV Alpha Particle Irradiation Examined by ToF-SIMS, SEM, and RGA G.L. Fisher, R.E. Lakis, C.C. Davis, C.J. Wetteland, Los Alamos National Laboratory, C.W. Szakal, N. Winograd, Pennsylvania State University |
| 2:40pm | AS-WeA3 Invited Paper Depth Profiling Analysis by Secondary Ion Mass Spectrometry: Historical Perspective and Current State-of-the-Art C.W. Magee, Evans East |
| 3:20pm | AS-WeA5 SIMS Depth Profiling of Deuterium Labeled Polymers in Polymer Films and Multilayers S.E. Harton, F.A. Stevie, D.P. Griffis, H. Ade, North Carolina State University |
| 3:40pm | AS-WeA6 Adjacent Electron Beam Method for SIMS Analysis of Insulators at High Depth Resolution Conditions Using a Magnetic Sector Instrument C. Gu, Z. Zhu, F.A. Stevie, D.P. Griffis, North Carolina State University |
| 4:00pm | AS-WeA7 Invited Paper The Atomic Motions behind Cluster Bombardment Secondary Ion Mass Spectrometry B.J. Garrison, Penn State University |
| 4:40pm | AS-WeA9 Comparison of TOF-SIMS and XPS Analysis Using a C@sub 60@ Ion Sputter Cleaning N. Sanada, T. Miyayama, J.S. Hammond, ULVAC-PHI, Inc., Japan, J.F. Moulder, S.R. Bryan, Physical Electronics |
| 5:00pm | AS-WeA10 TOF-SIMS Imaging of OLED Devices using a Au Cluster Ion Beam S.R. Bryan, Physical Electronics, J.S. Hammond, N. Sekiya, A. Yamamoto, ULVAC-PHI, Inc. |