The advent of cluster ion sources for Secondary Ion Mass Spectrometry (SIMS) has opened new applications for this technique. In particular, the C@super 60+@ ion beam appears to be quite promising as a source for imaging and depth profiling of molecular substrates. From a fundamental point of view, the obvious question is what are the atomic motions that result from the cluster vs. atomic bombardment? Using molecular dynamics computer simulations we have begun to elucidate the basics mechanisms of ejection or sputtering due to C@super 60@ bombardment of solids. Systems investigated to date include a clean Ag substrate,@footnote 1@ a thin film of benzene on Ag@footnote 2@ and water ice. The various systems investigated to date will be discussed along with relevant experimental data. @FootnoteText@ @footnote 1@ Enhancement of Sputtering Yields due to C@super 60@ vs. Ga Bombardment of Ag{111} as Explored by Molecular Dynamics Simulations, Z. Postawa, B. Czerwinski, M. Szewczyk, E. J. Smiley, N. Winograd and B. J. Garrison, Analytical Chemistry, 75, 4402-4407 (2003)@footnote 2@ Microscopic Insights into the Sputtering of Ag{111} Induced by C60 and Ga Bombardment of Ag{111}, Z. Postawa, B. Czerwinski, M. Szewczyk, E. J. Smiley, N. Winograd and B. J. Garrison, J. Phys. Chem. B, 108, 7831-7838 (2004) .