AVS 52nd International Symposium
    Applied Surface Science Wednesday Sessions
       Session AS-WeA

Paper AS-WeA5
SIMS Depth Profiling of Deuterium Labeled Polymers in Polymer Films and Multilayers

Wednesday, November 2, 2005, 3:20 pm, Room 206

Session: SIMS Cluster Probe Beams and General Topics
Presenter: S.E. Harton, North Carolina State University
Authors: S.E. Harton, North Carolina State University
F.A. Stevie, North Carolina State University
D.P. Griffis, North Carolina State University
H. Ade, North Carolina State University
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Thin planar polymer films are model systems for probing physical phenomena related to molecular confinement at polymer surfaces and polymer-polymer interfaces. Secondary Ion Mass Spectrometry (SIMS) can provide real-space depth profiles of tracer labeled polymers directly with sufficient depth resolution for optimal analysis of these systems. Three different bilayer systems have been used to investigate various physical phenomena at polymer-polymer interfaces, including reactive compatibilization and interfacial segregation. Deuterated polystyrene (dPS) has been employed as the tracer polymer and has been imbedded in a matrix of either unlabeled polystyrene (PS) or poly(cyclohexyl methacrylate) (PCHMA). Using selective solvents and a direct casting method, these doped films have been placed on either poly(methyl methacrylate) (PMMA) or poly(2-vinyl pyridine) (P2VP) and thermally annealed. X-ray specular reflectivity measurements confirm ultra-sharp interfaces between the two polymers using this preparation method, allowing for maximum depth resolution during SIMS analysis. Varied analysis conditions for a magnetic sector instrument (CAMECA IMS-6f) were used to optimize the depth resolution and sensitivity while minimizing matrix effects and sample charging. For all systems Cs+ and O2+ have been used as the primary ion source, with detection of negative and positive secondary ions, respectively. Impact energy and primary ion species have been shown to affect matrix ion count rate for the various films studied. Conditions required to achieve constant matrix secondary ion yield across the heterogeneous interface are discussed.