| AVS 49th International Symposium | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-TuP1 Observation of Preferably Electrical Activation of Boron Implanted at Low Energy by Scanning Capacitance Microscopy M.-N. Chang, National Nano Device Laboratories, Taiwan R.O.C., D.-H. Deng, National Tsing Hua University, Taiwan R.O.C., C.-Y. Chen, National Nano Device Laboratories, Taiwan R.O.C., J.-H. Liang, National Tsing Hua University, Taiwan R.O.C., F.M. Pan, National Nano Device Laboratories, Taiwan R.O.C. |
| AS-TuP2 Development of a Large Area XPS Imaging Instrument T. Tazawa, M. Kato, M. Kudo, Y. Iijima, K. Tsutsumi, JEOL Ltd., Japan |
| AS-TuP3 Compensating for the Ubiquitous Hydrocarbon Overlayer to Enable Quantification of the Elemental Composition from XPS; the Air-formed Film at the Aluminium Surface M.R. Alexander, G.E. Thompson, X. Zhou, UMIST, UK, G. Beamson, Daresbury Laboratories, UK |
| AS-TuP4 Multivariate ToF-SIMS Image Analysis of Patterned Protein Surfaces B. Wickes, D.G. Castner, University of Washington |
| AS-TuP5 Thermally Isolated Support Membrane for Low-noise Si JFET Amplifiers Y. Bae, J. Podosek, M. Yun, J. Bock, K. Sukhatme, E. Jones, Jet Propulsion Laboratory |
| AS-TuP6 Non-destructive Depth Profiling Analysis of Surface Oxidation of @beta@-FeSi@sub 2@ Thin Film on Si (100) by SR-XPS T. Saito, H. Yamamoto, K. Yamaguchi, Japan Atomic Energy Research Institute, M. Haraguchi, Ibaraki University, Japan, T. Nakanoya, Japan Atomic Energy Research Institute, M. Imamura, N. Matsubayashi, T. Tanaka, H. Shimada, National Institute of Advanced Industrial Science and Technology, Japan, K. Hojou, Japan Atomic Energy Research Institute |
| AS-TuP7 Surface Characterisation of Fluorinated Polyether Ionomers from Aqueous Dispersions R. Canteri, G. Speranza, M. Anderle, ITC-irst Centre for Scientific and Technological Research, Italy, S. Turri, S. Radice, Ausimont Spa Research & Development Centre, Italy |
| AS-TuP8 A New Transparent Conducting Oxide: Indium Molybdenum Oxide (In@sub 2@O@sub 3@ : Mo) Y. Yoshida, Colorado School of Mines, T.J. Coutts, T.A. Gessert, National Renewable Energy Laboratory |
| AS-TuP9 SIMS Analysis of Copolymers: A Test for Statistical Ordering A.G. Shard, University of Sheffield, UK, S. Clarke, M.C. Davies, University of Nottingham, UK |
| AS-TuP10 Impurity Dopant Profile Measurement and its Quantitative Analysis using Nano Capacitance-Voltage (NCV) Method E.-S. Kang, H.-J. Hwang, Chung-Ang University, Korea, G.-Y. Lee, Samchok National University, Korea |
| AS-TuP11 A Quantitative Comparison between Rutherford Backscattering and Time-of-Flight Medium Energy Backscattering B.R. Rogers, R.D. Geil, Z. Song, D.W. Crunkelton, R.A. Weller, V. Pawar, Vanderbilt University |
| AS-TuP12 SIMS Depth Profiling of Multilayer Structures A. Godines, Yu. Kudriavtsev, A. Villegas, R. Asomoza, CINVESTAV-IPN, Mexico |
| AS-TuP13 Sample Topography Developed by Sputtering in Cameca Instruments: an AFM and SEM Study E. Iacob, M. Bersani, A. Lui, L. Vanzetti, D. Giubertoni, M. Barozzi, M. Anderle, ITC-irst, Italy |
| AS-TuP14 Comparison of Experimental Protocol for Low Energy Sputter Yield Measurements of Advanced Materials as a Function of Sputtering Angle V.S. Smentkowski, General Electric - Global Research Center, S. Hu, Lockheed Martin |
| AS-TuP15 Mathematical Topographical Correction of XPS Images using Multivariate Statistical Methods K. Artyushkova, S. Pylypenko, J.E. Fulghum, Kent State University |
| AS-TuP16 High Spatial Resolution XPS Analysis of Si Samples Prepared using the FIB Lift-out Technique J. Fenton, A. Ferryman, J.E. Fulghum, Kent State University, L.A. Giannuzzi, University of Central Florida, F.A. Stevie, North Carolina State University |
| AS-TuP17 Elucidation of Three-Dimensional Structure in Polymer Blends using Correlated Confocal Microscopy and XPS Imaging L.A. Broadwater, K. Artyushkova, I. Smalyukh, O. Lavrentovich, J.E. Fulghum, Kent State University |
| AS-TuP18 Correlative XPS and AFM: Chemical Phase Identification in Polymers J. Farrar, K. Artyushkova, J.E. Fulghum, Kent State University |
| AS-TuP19 Surface Studies of Corrosion of Stainless Steel by Lead-Bismuth Eutectic A.L. Johnson, D. Koury, B. Hosterman, D. Parsons, University of Nevada, Las Vegas, D. Perry, Lawrence Berkeley National Laboratory, J. Farley, University of Nevada, Las Vegas |
| AS-TuP20 Initial Tests of a Draft Protocol for Wide Scan XPS Measurements M.H. Engelhard, D.R. Baer, Pacific Northwest National Laboratory |
| AS-TuP21 Surface Characterization of Nanoparticles for Cast Dispersion Strengthened Metal Matrix Nanocomposites A.L. Linsebigler, V.S. Smentkowski, T. Angeliu, General Electric Global Research Center |
| AS-TuP22 Basic Characterization of Arcing in Sputtering Targets F.G. Tomasel, D. Carter, H. Walde, J.J. Gonzalez, G.A. Roche, Advanced Energy, Inc. |
| AS-TuP23 Characterization of Plasma Source Ion Implanted Stainless Steel for High Voltage Applications N.D. Theodore, College of William and Mary, C. Hernandez, Jefferson Lab, D.M. Manos, College of William and Mary, H.F. Dylla, Jefferson Lab, R. Moore, University at Albany Institute for Materials, T. Siggins, Jefferson Lab |
| AS-TuP24 Nano-scale Mapping of Surface-photo-voltage by Scanning Tunneling Microscope : Ag/Si(001) O. Takeuchi, S. Yoshida, H. Shigekawa, University of Tsukuba, CREST, Japan |