AVS 49th International Symposium
    Applied Surface Science Tuesday Sessions
       Session AS-TuP

Paper AS-TuP20
Initial Tests of a Draft Protocol for Wide Scan XPS Measurements

Tuesday, November 5, 2002, 5:30 pm, Room Exhibit Hall B2

Session: Topics in Applied Surface Science
Presenter: M.H. Engelhard, Pacific Northwest National Laboratory
Authors: M.H. Engelhard, Pacific Northwest National Laboratory
D.R. Baer, Pacific Northwest National Laboratory
Correspondent: Click to Email
In May 2002 an international workshop on developing an expert XPS system was held in St. Malo, France. One output of that workshop, developed by a task group lead by Prof. James Castle, was a draft protocol for collecting a maximum amount of information from wide scan data. Although similar to approaches already used in some laboratories, the protocol is significantly different than the default wide scan spectra for most instruments and suggests that a significant amount of information can be routinely extracted from wide scan data that is generally ignored or missed. Although parts of the draft protocol (step size, scan width and preliminary charge correction) are common practice for use of our Quantum 2000, other parts (energy resolution, analysis for layered structure) are different than our usual practice. This paper reports our preliminary experience in a manual application of the initial version of this draft protocol to "routine" samples in our laboratory. @FootnoteText@ This work was conducted in the Environmental Molecular Sciences Laboratory, a U. S. Department of Energy User Facility run by Battelle Memorial Institute.