AVS 49th International Symposium
    Applied Surface Science Tuesday Sessions
       Session AS-TuP

Paper AS-TuP18
Correlative XPS and AFM: Chemical Phase Identification in Polymers

Tuesday, November 5, 2002, 5:30 pm, Room Exhibit Hall B2

Session: Topics in Applied Surface Science
Presenter: J. Farrar, Kent State University
Authors: J. Farrar, Kent State University
K. Artyushkova, Kent State University
J.E. Fulghum, Kent State University
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AFM can be utilized to provide both topographical and phase contrast information from polymeric materials. AFM phase contrast images potentially contain chemical information, although image interpretation can be challenging. XPS images contain chemical phase information, but at a significantly different spatial resolution. In this study we evaluate methods for the correlation of images with varying spatial resolutions, focusing on XPS and AFM. Processing for image correlation includes resizing, image alignment and resolution matching. Following imaging processing, classification methods are used to correlate components present in XPS and AFM images. Data from a variety of polymer samples will be used to demonstrate that classification of XPS and AFM images can be used to identify chemical phases in AFM images. This work has been partially supported by NSF ALCOM (DMR89-20147) and NSF CHE-0113724.