AVS 66th International Symposium & Exhibition | |
Advanced Ion Microscopy and Ion Beam Nano-engineering Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
2:20pm | HI+AS+CA-WeA1 Invited Paper Analytical Capabilities on FIB Instruments using SIMS: Applications, Current Developments and Prospects Tom Wirtz, J.-N. Audinot, J. Lovric, O. De Castro, Luxembourg Institute of Science and Technology, Luxembourg |
3:00pm | HI+AS+CA-WeA3 Correlated Materials Characterization via Multimodal Chemical Imaging using HIM-SIMS A. Belianinov, Oak Ridge National Laboratory, S. Kim, Pusan National University, South Korea, A. Trofimov, Olga S. Ovchinnikova, Oak Ridge National Laboratory |
3:20pm | HI+AS+CA-WeA4 Compositional Characterization of Biogenic Nanoparticles using the ORION NanoFab with SIMS Christelle Guillermier, F. Khanom, Carl Zeiss PCS, Inc., D. Medina, Northeastern University, J.-N. Audinot, Luxembourg Institute of Science and Technology, Luxembourg |
4:20pm | HI+AS+CA-WeA7 Invited Paper Effects of Ion Irradiation on Two-Dimensional Targets: What is Different from Bulk Materials Arkady V. Krasheninnikov, Helmholtz-Zentrum Dresden-Rossendorf, Germany |
5:00pm | HI+AS+CA-WeA9 Effects of He Ion Irradiation on Gold Nanoclusters: a Molecular Dynamics Study Sadegh Ghaderzadeh, M. Ghorbani-Asl, S. Kretschmer, G. Hlawacek, Helmholtz-Zentrum Dresden Rossendorf, Germany, A.V. Krasheninnikov, Helmholtz-Zentrum Dresden-Rossendorf, Germany |
5:20pm | HI+AS+CA-WeA10 Low Damage Imaging of Polymers with the Helium Ion Microscope Doug Wei, Carl Zeiss, RMS, Inc., J.A. Notte, Carl Zeiss PCS, Inc., A. Stratulat, Carl Zeiss Microscopy, Ltd., UK |
5:40pm | HI+AS+CA-WeA11 Imaging of Biological Cells with Helium-Ion Microscopy Natalie Frese, A. Beyer, C. Kaltschmidt, B. Kaltschmidt, Bielefeld University, Germany, A. Thomas, Institute for Metallic Materials Dresden, Germany, W. Parak, University of Hamburg, Germany, A. Gölzhäuser, Bielefeld University, Germany |
6:00pm | HI+AS+CA-WeA12 Channeling in the Helium Ion Microscope Hussein Hijazi, C. Feldman, R. Thorpe, M. Li, T. Gustafsson, Rutgers University, D. Barbacci, A. Schultz, Ionwerks |