AVS 66th International Symposium & Exhibition
    Advanced Ion Microscopy and Ion Beam Nano-engineering Focus Topic Wednesday Sessions

Session HI+AS+CA-WeA
Advanced Ion Microscopy and Surface Analysis Applications

Wednesday, October 23, 2019, 2:20 pm, Room B231-232
Moderators: Richard Livengood, Intel Corporation, USA, Armin Gölzhäuser, Bielefeld University, Germany


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:20pm HI+AS+CA-WeA1 Invited Paper
Analytical Capabilities on FIB Instruments using SIMS: Applications, Current Developments and Prospects
Tom Wirtz, J.-N. Audinot, J. Lovric, O. De Castro, Luxembourg Institute of Science and Technology, Luxembourg
3:00pm HI+AS+CA-WeA3
Correlated Materials Characterization via Multimodal Chemical Imaging using HIM-SIMS
A. Belianinov, Oak Ridge National Laboratory, S. Kim, Pusan National University, South Korea, A. Trofimov, Olga S. Ovchinnikova, Oak Ridge National Laboratory
3:20pm HI+AS+CA-WeA4
Compositional Characterization of Biogenic Nanoparticles using the ORION NanoFab with SIMS
Christelle Guillermier, F. Khanom, Carl Zeiss PCS, Inc., D. Medina, Northeastern University, J.-N. Audinot, Luxembourg Institute of Science and Technology, Luxembourg
4:20pm HI+AS+CA-WeA7 Invited Paper
Effects of Ion Irradiation on Two-Dimensional Targets: What is Different from Bulk Materials
Arkady V. Krasheninnikov, Helmholtz-Zentrum Dresden-Rossendorf, Germany
5:00pm HI+AS+CA-WeA9
Effects of He Ion Irradiation on Gold Nanoclusters: a Molecular Dynamics Study
Sadegh Ghaderzadeh, M. Ghorbani-Asl, S. Kretschmer, G. Hlawacek, Helmholtz-Zentrum Dresden Rossendorf, Germany, A.V. Krasheninnikov, Helmholtz-Zentrum Dresden-Rossendorf, Germany
5:20pm HI+AS+CA-WeA10
Low Damage Imaging of Polymers with the Helium Ion Microscope
Doug Wei, Carl Zeiss, RMS, Inc., J.A. Notte, Carl Zeiss PCS, Inc., A. Stratulat, Carl Zeiss Microscopy, Ltd., UK
5:40pm HI+AS+CA-WeA11
Imaging of Biological Cells with Helium-Ion Microscopy
Natalie Frese, A. Beyer, C. Kaltschmidt, B. Kaltschmidt, Bielefeld University, Germany, A. Thomas, Institute for Metallic Materials Dresden, Germany, W. Parak, University of Hamburg, Germany, A. Gölzhäuser, Bielefeld University, Germany
6:00pm HI+AS+CA-WeA12
Channeling in the Helium Ion Microscope
Hussein Hijazi, C. Feldman, R. Thorpe, M. Li, T. Gustafsson, Rutgers University, D. Barbacci, A. Schultz, Ionwerks