AVS 66th International Symposium & Exhibition


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Advanced Ion Microscopy and Ion Beam Nano-engineering Focus Topic Sessions

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Start Time Session Code Session Title
Wednesday 2:20pm HI+AS+CA-WeA Advanced Ion Microscopy and Surface Analysis Applications
Thursday 8:00am HI+NS-ThM Novel Beam Induced Material Engineering and Nano-Patterning
Thursday 2:20pm HI+NS-ThA Emerging Ion Sources, Optics, and Applications
Thursday 6:30pm HI-ThP Advanced Ion Microscopy Poster Session

AVS 66th International Symposium & Exhibition