AVS 66th International Symposium & Exhibition | |
Advanced Ion Microscopy and Ion Beam Nano-engineering Focus Topic | Wednesday Sessions |
Session HI+AS+CA-WeA |
Session: | Advanced Ion Microscopy and Surface Analysis Applications |
Presenter: | Sadegh Ghaderzadeh, Helmholtz-Zentrum Dresden Rossendorf, Germany |
Authors: | S. Ghaderzadeh, Helmholtz-Zentrum Dresden Rossendorf, Germany M. Ghorbani-Asl, Helmholtz-Zentrum Dresden Rossendorf, Germany S. Kretschmer, Helmholtz-Zentrum Dresden Rossendorf, Germany G. Hlawacek, Helmholtz-Zentrum Dresden Rossendorf, Germany A.V. Krasheninnikov, Helmholtz-Zentrum Dresden-Rossendorf, Germany |
Correspondent: | Click to Email |
Finally, we discuss the implications of our results for the analysis of HIM images of metal clusters.