| AVS 66th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | EL+EM-WeA1 Optical Hall Effect in the Multi-valley Semiconductor Te-doped GaSb Farzin Abadizaman, C. Emminger, New Mexico State University, S. Knight, University of Nebraska-Lincoln, M. Schubert, University of Nebraska-Lincoln, Linköping University, Sweden, Leibniz Institute of Polymer Research Dresden, Germany, S. Zollner, New Mexico State University |
| 2:40pm | EL+EM-WeA2 Study of the Temperature-dependent Optical Constants of Noble Metals based on High Temperature Spectroscopic Ellipsometry Jiamin Liu, H. Jiang, S.Y. Liu, Huazhong University of Science and Technology, China |
| 3:00pm | EL+EM-WeA3 Optical Monitor for the Attitude Tracking using Polarimetry Song Zhang, H.G. Gu, H. Jiang, S.Y. Liu, Huazhong University of Science and Technology, China |
| 3:20pm | EL+EM-WeA4 New Progress on the Channeled Spectroscopic Ellipsometry and its Applications Gai Chin, ULVAC Inc., Japan |
| 4:20pm | EL+EM-WeA7 Invited Paper The Physics of Low Symmetry Metal Oxides: Applications of Ellipsometry Alyssa Mock, U.S. Naval Research Laboratory, S. Knight, M. Hilfiker, University of Nebraska-Lincoln, V. Darakchieva, A. Papamichail, Linkoping University, Sweden, R. Korlacki, University of Nebraska-Lincoln, M.J. Tadjer, U.S. Naval Research Laboratory, Z. Galazka, G. Wagner, Leibniz-Institut für Kristallzüchtung, Germany, N. Blumenschein, North Carolina State University, A. Kuramata, Novel Crystal Technology, Inc., Japan, K. Goto, H. Murakami, Y. Kumagai, Tokyo University of Agriculture and Technology, Japan, M. Higashiwaki, National Institute of Information and Communications Technology, Japan, A. Mauze, Y. Zhang, J.S. Speck, University of California Santa Barbara, M. Schubert, University of Nebraska-Lincoln, Linköping University, Sweden, Leibniz Institute of Polymer Research Dresden, Germany |
| 5:00pm | EL+EM-WeA9 Terahertz Dielectric Anisotropy in Randomly Distributed, Spatially Coherent Polymethacrylate Microwire Arrays Fabricated by Stereolithography Serang Park, Y. Li, University of North Carolina at Charlotte, S. Lee, Harris Corp., S. Schӧche, C.M. Herzinger, J.A. Woollam Co., Inc., T. Hofmann, University Of North Carolina at Charlotte |
| 5:20pm | EL+EM-WeA10 Ultrafast Dynamics of Ge, InP and Si Proved by Time-Resolved Ellipsometry Shirly Espinoza, S. Richter, M. Rebarz, Institute of Physics, Academy of Sciences of the Czech Republic, Czechia, O. Herrfurth, R. Schmidt, Universität Leipzig, Felix-Bloch-Institut für Festkörperphysik, Germany, J. Andreasson, Institute of Physics, Academy of Sciences of the Czech Republic, Czechia, S. Zollner, New Mexico State University |
| 5:40pm | EL+EM-WeA11 Optical Properties of Organic-Inorganic Lead Halide Perovskite Thin Films for Photovoltaics Biwas Subedi, M.M. Junda, K. Ghimire, N.J. Podraza, University of Toledo |
| 6:00pm | EL+EM-WeA12 Optical Constants of Ni at 300 K from 0.03 to 6.0 eV Stefan Zollner, F. Abadizaman, New Mexico State University |