AVS 66th International Symposium & Exhibition
    Spectroscopic Ellipsometry Focus Topic Wednesday Sessions
       Session EL+EM-WeA

Paper EL+EM-WeA11
Optical Properties of Organic-Inorganic Lead Halide Perovskite Thin Films for Photovoltaics

Wednesday, October 23, 2019, 5:40 pm, Room A212

Session: Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches
Presenter: Biwas Subedi, University of Toledo
Authors: B. Subedi, University of Toledo
M.M. Junda, University of Toledo
K. Ghimire, University of Toledo
N.J. Podraza, University of Toledo
Correspondent: Click to Email

Organic-inorganic lead halide perovskite based photovoltaics (PV) exhibit high initial efficiency, can be solution processed with potentially low material costs, and material band gaps can be tuned by composition. Unfortunately, these perovskites exhibit degradation upon exposure to atmosphere, light, and heat. Spectroscopic ellipsometry over the near infrared to ultraviolet range (0.73-5.9 eV) has been applied to characterize the complex optical response of solution processed ABX3 (A: methylammonium—MA, formamidinium—FA, Cs; B: Pb, Sn; X: I, Br, Cl) perovskite thin films of different compositions. A parametric optical property model has been developed which includes contributions from electronic transitions above the band gap, the direct band gap, an exponentially decaying Urbach tail, and sub-gap absorption due to defect states. Using this model, above gap critical points, band gap energies, and sub-gap absorption are compared primarily as functions of A- and B-cation compositions for thin films. In situ, real time spectroscopic ellipsometry (RTSE) of perovskite films undergoing degradation induced by controlled relative humidity is used to track optical properties changes, particularly with respect to sub-gap absorption, and morphology changes occurring at the substrate / film and film / ambient interfaces. These optical property and morphology changes are tracked by RTSE for perovskite thin films of different compositions. Optical properties characterized by spectroscopic ellipsometry are used as input for external quantum efficiency (EQE) simulations of perovskite based PV devices. Comparisons between simulated and measured EQE spectra are used to identify differences in perovskite characteristics arising from the complete solar cell device fabrication process.