| AVS 60th International Symposium and Exhibition | |
| Applied Surface Science | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-ThP1 Wide-Range Parallel XPS Imaging for Feature Identification T.S. Nunney, A.E. Wright, P. Mack, Thermo Fisher Scientific, UK |
| AS-ThP3 Evaluating the Stability of Li-O2 Battery Components on Cathode/Electrolyte Interface by XPS E. Nasybuiln, M. Engelhard, W. Xu, J. Zhang, Pacific Northwest National Laboratory |
| AS-ThP4 Surface Modification of Multiferroic BiFeO3 Ceramic by Argon Sputtering P. Wang, M. Guttag, Bradley University, C. Tu, Fu Jen Catholic University, Taiwan, Republic of China |
| AS-ThP5 In Situ Plasma Cleaning of Samples Prior to XPS and ToF-SIMS Analysis V. Smentkowski, H. Piao, General Electric Global Research Center |
| AS-ThP6 Spectral Chemical State Imaging with High Spatial Resolution Scanning Auger D.F. Paul, Physical Electronics Inc. |
| AS-ThP7 Laser Induced Breakdown Spectroscopy for Surface Mapping of Thin Polymer Films C.Y. Chou, National Taiwan University, Taiwan, Republic of China, P.R. Chou, Chinese Culture University, Taiwan, Republic of China, J. Lee, Optimization Solutions Asia Engineering Co. Ltd., Taiwan, Republic of China, R.B. Lin, Chinese Culture University, Taiwan, Republic of China, C.C. Hsu, National Taiwan University, Taiwan, Republic of China |
| AS-ThP8 Variables Affecting Fabric Water-Repellency: Enabling Property Correlations through the use of Secondary Ion Mapping Coupled with Multivariate Statistical Analysis K.G. Lloyd, S. Brown, L. Zhang, J.R. Marsh, D.E. Davidson, DuPont Corporate Center for Analytical Sciences, T. Madeleine, DuPont |
| AS-ThP9 Enhanced TOF-SIMS Analysis of Polymers and Biological Samples R. Price, G.L. Fisher, S.R. Bryan, J.S. Hammond, Physical Electronics Inc., I. Ishizaki, S. Iida, T. Miyayama, ULVAC-PHI, Inc., Japan |
| AS-ThP12 XPS and ToF-SIMS Sputter Depth Profiling of OLEDs using Ar Cluster Ion Sources M. Bruns, K. Peters, P. Scharfer, W. Schabel, Karlsruhe Institute of Technology, Germany, H. Hummel, Philips Technologie GmbH, Germany, T.S. Nunney, ThermoFisher Scientific, UK, E. Tallarek, Tascon GmbH, Germany, S. Kayser, ION-TOF GmbH, Germany |
| AS-ThP13 Depth Profiling of OLED and OPV Materials by Cluster Ion Beams K.D. Bomben, J.S. Hammond, J.F. Moulder, S.S. Alnabulsi, S.N. Raman, Physical Electronics Inc., N.C. Erickson, R.J. Holmes, University of Minnesota |
| AS-ThP15 Selective Chemistry for the Atomic Layer Deposition (ALD) of Alumina Oxide on Silicon Surfaces L. Guo, F. Zaera, University of California, Riverside |
| AS-ThP16 Analysis of Doped Amorphous Carbon Film for Heat-assisted Magnetic Recording Application R.Y. Zheng, R. Ji, L. Lu, H.L. Seet, Data Storage Institute, Singapore |
| AS-ThP18 Application of Dye-Sensitized Solar Cells using ZnO Nanoparticles and Nanorods S.-H. Nam, J.-H. Boo, B. Hong, Y. Kim, Sungkyunkwan University, Republic of Korea |
| AS-ThP19 Generation of White Light from Sr2SiO4 Doped with Lanthanides M.A. Tshabalala, O.M. Ntwaeaborwa, H. Swart, University of the Free State, South Africa |
| AS-ThP21 Thermally-Induced Evolution of Hydrogenated Amorphous Carbon Surfaces R.W. Carpick, F. Mangolini, J. Hilbert, J.R. Lukes, University of Pennsylvania |
| AS-ThP22 Contact-free Pyroelectric Measurements using X-ray Photoelectron Spectroscopy H. Cohen, D. Ehre, The Weizmann Institute of Science, Israel |