AVS 50th International Symposium


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High-k Gate Dielectrics and Devices Topical Conference Sessions

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Start Time Session Code Session Title
Monday 8:20am DI-MoM Electronic Properties of High-k Dielectrics and their Interfaces
Monday 2:00pm DI-MoA High-k Dielectric Stability
Tuesday 8:20am DI-TuM High-k Dielectric Growth and Processing
Tuesday 2:00pm DI-TuA High-k Dielectric Characterization
Tuesday 5:30pm DI-TuP Poster Session

AVS 50th International Symposium