| IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11) | |
| Thin Films | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| TF-MoP1 The Interfacial Reaction in the W/WN@sub x@/poly Si@sub 1-x@Ge@sub x@ with Ge Contents and Annealing Process S.-K. Kang, J.J. Kim, D.-H. Ko, Yonsei University, Korea, H.B. Kang, Sungkyunkwan University, Korea, T.H. Ahn, I.S. Yeo, Hynix Semiconductor Inc., Korea, T.W. Lee, Y.H. Lee, Ju-Sung Eng., Korea |
| TF-MoP2 The Role of Interfaces in Fe/W and Co/W Multilayers E. Majkova, A. Anopchenko, Y. Chushkin, M. Jergel, S. Luby, R. Senderak, Institute of Physics SAS, Slovak Republic |
| TF-MoP3 Intermixing Phenomena in Immiscible Ag/Co Bilayers and Co/Ag/Co Trilayers under KrF Laser Annealing S. Luby, E. Majkova, M. Jergel, R. Senderak, Institute of Physics SAS, Slovak Republic, P. Mengucci, G. Majni, Uni. Ancona, Italy, E. D'Anna, G. Leggieri, A. Luches, M. Martino, Uni. Lecce, Italy |
| TF-MoP4 The Study of Growth of Al on Polyimide Free-standing Films X.-F. Lin, Charles Evans & Associates, D.A. Grove, Luxel Corporation, T.F. Fister, L.P. Bisaha, G.S. Strossman, L.-C. Wei, Charles Evans & Associates, G. Lefever-Button, Luxel Corporation, J.R. Kingsley, I.D. Ward, R.W. Odom, P.M. Lindley, Charles Evans & Associates |
| TF-MoP5 Amorphous Silicon Photodiodes for Image Sensing M. Ristova, Texas A&M University and University in Skopje, Republic of Macedonia, Y. Kuo, H.H. Lee, S. Lee, J.Y. Tewg, Texas A&M University |
| TF-MoP6 Li3PO4:N/LiCoO2 Coatings for Thin Film Batteries M.E. Gross, P.M. Martin, D.C. Stewart, J.W. Johnston, C.F. Windisch, G.L. Graff, Pacific Northwest National Laboratory, P.L. Rissmiller, E.L. Dudeck, Mine Safety Appliances Company |
| TF-MoP8 Degradation Mechanisms of Low-Temperature Poly-Si Thin-Film Transistors with PECVD TEOS Oxide H.W. Zan, P.S. Shih, T.C. Wu, National Chiao Tung University, Taiwan, T.C. Chang, National Sun Yat-Sen University, Taiwan, C.Y. Chang, D.Z. Peng, National Chiao Tung University, Taiwan |
| TF-MoP9 Atomic Force Microscopy Observation of TiO@sub2@ Films Deposited by dc Reactive Sputtering T. Takahashi, H. Nakabayashi, N. Sasai, K. Masugata, Toyama University, Japan |
| TF-MoP10 Effects of Annealing Conditions on Doping Efficiency in the Indium Tin Oxide Thin Films Deposited at Low Temperature J.W. Bae, S.D. Park, D.H. Lee, Y.J. Lee, G.Y. Yeom, Sungkyunkwan University, Korea |
| TF-MoP12 Electrical Properties for Si Doped Glass Light Emitter T. Ichinohe, Tokyo National College of Technology, Japan, S. Nozaki, H. Morisaki, The University of Electro-Communications, Japan, S. Masaki, Tokyo National College of Technology, Japan, K. Kawasaki, TDY Co. Ltd., Japan |
| TF-MoP14 Characterization of Pb(Zr@sub0.52@Ti@sub0.48@)O@sub3@ Films in the Thickness Range of 0.4-6.0µm Prepared by Pulsed Laser Deposition M.C. Kim, Yonsei University, Korea, J.W. Choi, S.J. Yoon, H.J. Kim, Korea Institute of Science and Technology, K.Y. Yoon, Yonsei University, Korea |
| TF-MoP16 The Effect of the Process Parameters on the Electrical Properties of Ni-Cr-Al-Mn-Si Alloy Thin Films B.J. Lee, Inha University, Korea, C.S. Kim, Korea Electronics Technology Institute, G.B. Park, Yuhan College, Korea, D.C. Lee, Inha University, Korea |
| TF-MoP17 Electrical Properties of the Novel Semiconductor Alloy Cu@sub x@Cd@sub 1-x@Te Prepared by rf Sputtering E. Garnett-Ruiz, G. Torres-Delgado, O. Jiménez-Sandoval, R. Perez-Castanedo, P. Garcia-Jimenez, Cinvestav-IPN, Mexico, B.S. Chao, Energy Conversion Devices, S. Jiménez-Sandoval, Cinvestav-IPN, Mexico |
| TF-MoP18 Characterization of Hydrogenated Amorphous Germanium, a-Ge:H, Thin Films Deposited by a Low Pressure Hollow Cathode Plasma-jet Reactive Sputtering System G. Pribil, R.J. Soukup, N.J. Ianno, University of Nebraska, Lincoln, Z. Hubicka, Academy of Sciences |
| TF-MoP19 Metal-insulator Transition in Ultrathin Copper Film Observed By Impedance Spectroscopy X. Jin, Y. Zhou, Y.H. Hyun, T.-U. Nahm, C.O. Kim, Y.P. Lee, Hanyang University, Korea |
| TF-MoP20 In-situ Buried Multiquantum Well Structures Studied by Photoreflectance and Photoluminescence Spectroscopy A. Perez-Centeno, M. Lopez-Lopez, M. Melendez-Lira, M. Tamura, CINVESTAV-IPN, Mexico, T. Ishikawa, OTL, Tsukuba, Japan |