AVS 45th International Symposium | |
Applied Surface Science Division | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:20am | AS-MoM1 Invited Paper Synchrotron Based Low Z Materials Analysis D.A. Fischer, National Institute of Standards and Technology |
9:00am | AS-MoM3 Contribution of a Fano Resonance and Pt-H EXAFS in the Pt L@sub 23@ XANES of Supported Pt Particles: Application to Materials Characterization D.E. Ramaker, George Washington University, B.L. Mojet, Utrecht University, The Netherlands, J.T. Miller, Amoco, D.C. Koningsberger, Utrecht University, The Netherlands |
9:20am | AS-MoM4 An Investigation of the Surface Chemistry of Lubricant Additives on Steel by NEXAFS Spectroscopy T.S. Rufael, J.K. Mowlem, Texaco Inc., D.A. Fischer, National Institute of Standards and Technology |
9:40am | AS-MoM5 Invited Paper Small Area Analysis: The Synergism of FIB/TEM Instrumentation L.A. Giannuzzi, B.I. Prenitzer, J.L. Drown, University of Central Florida, S.R. Brown, Cirent Semiconductor, T.L. Shofner, Bartech Group, R.B. Irwin, F.A. Stevie, Cirent Semiconductor |
10:20am | AS-MoM7 Small Area X-ray Photoelectron Spectroscopy using a Spherical Mirror Analyzer B.J. Tielsch, S.P. Page, Kratos Analytical Ltd, United Kingdom, D.J. Surman, Kratos Analytical, Inc., S. Scierka, Millenium Inorganic Chemicals, E.A. Thomas, J.E. Fulghum, Kent State University |
10:40am | AS-MoM8 Analysis of Heterogeneous Polymer Samples using XPS J.E. Fulghum, E.A. Thomas, A.C. Ferryman, Kent State University, B.J. Tielsch, Kratos Analytical, United Kingdom |
11:00am | AS-MoM9 TOF-SIMS analysis of Atmospheric Aerosol R.E. Peterson, B.J. Tyler, Montana State University |
11:20am | AS-MoM10 Evaluation of Ge Based Detectors for Small Area Analysis X. Lu, J.R. Kingsley, Charles Evans & Associates |
11:40am | AS-MoM11 Detection and Passivation of Surface States in InP by Thermally Stimulated Exo-electron Emission Spectroscopy S.S. Hullavarad, S.V. Bhoraskar, University of Pune, India |