AVS 45th International Symposium
    Applied Surface Science Division Monday Sessions
       Session AS-MoM

Paper AS-MoM9
TOF-SIMS analysis of Atmospheric Aerosol

Monday, November 2, 1998, 11:00 am, Room 307

Session: Materials Analysis (including Small Dimensions and Synchrotron)
Presenter: R.E. Peterson, Montana State University
Authors: R.E. Peterson, Montana State University
B.J. Tyler, Montana State University
Correspondent: Click to Email
We are evaluating the potential for using TOF-SIMS to study single particles from atmospheric aerosol. X-ray analysis has commonly been used to analyze the composition of single particles but there are several limitations to X-ray analysis. Principally, x-ray analysis cannot be used to study organic compounds in the aerosol, it offers low sensitivity for light elements common in crustal material and it cannot distinguish isotopes. TOF-SIMS has the potential to provide superior performance in these areas. Samples of naturally occurring and anthropogenic atmospheric aerosol were collected on Millipore fluoropore (PTFE) filters in southwest montana. Sections of the filters were imaged using a PHI TRIFT I instrument with a Ga primary ion source. Both positive and negative ion images were studied. A large number of particles could be distinguished on the filter surfaces, which were absent on control samples. Particle diameters varied from 2 to 10 µm. Hydrocarbons, silicon, aluminum, potassium, calcium, and sulfates were associated with the particles found in the images. These correspond to common sources of aerosol in the region including crustal dust, partially neutralized sulfuric acid droplets, and carbonaceous compounds associated with forest fires. The aerosol found indicate a combination of particles originating from gas to particle conversion and surface sources