AVS 45th International Symposium
    Applied Surface Science Division Monday Sessions
       Session AS-MoM

Paper AS-MoM8
Analysis of Heterogeneous Polymer Samples using XPS

Monday, November 2, 1998, 10:40 am, Room 307

Session: Materials Analysis (including Small Dimensions and Synchrotron)
Presenter: J.E. Fulghum, Kent State University
Authors: J.E. Fulghum, Kent State University
E.A. Thomas, Kent State University
A.C. Ferryman, Kent State University
B.J. Tielsch, Kratos Analytical, United Kingdom
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The surface of samples prepared from polymer blends may have a composition different from that of the bulk material. If the polymers are not completely miscible, lateral heterogeneities on the surface may exist as well. Surfaces which are heterogeneous on the scale of microns can be characterized by XPS through small area spectroscopy and imaging. Determining the existence of concentration gradients within the XPS sampling depth is difficult for such samples, however. Several polymer blend systems will be used to demonstrate the near-surface and bulk gradient information which can be obtained from polymer blends if a combination of XPS experiments is utilized. Significant information can be obtained from quantitative analysis of the valence band, and this will be compared to results utilizing core level spectra. Polymer systems to be discussed include blends of modified polyimides used in liquid crystal displays, poly(vinyl chloride) and poly(methyl methacrylate) (PVC and PMMA) blends which have been previously studied using using XPS, TOF- SIMS and FTIR, and polyacrylates. This work has been partially supported by NSF (CHE-9631702, CHE-9613880, DMR89-20147) and 3M.