AVS 52nd International Symposium | |
Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
AS-MoP2 Unusual Interdiffusion Reactions in Multilayer ZrO@sub 2@CaO/Fe/Si Thin Films H. Piao, L. Le Tarte, L. Denault, J.R. Cournoyer, K. Dovidenko, M. Larsen, J. Osaheni, General Electric Co., Global Research Center |
AS-MoP3 Synthesis and Characterization of Spectroscopic Tags Based Surface-Enhanced Raman Spectroscopy (SERS) of BPE Adsorbed on Gold Nanoparticles M.C. Burrell, GE Global Research Center |
AS-MoP4 Dimensional Effects of Metal Nanoparticles on Their Characterization by X-ray Photoelectron Spectroscopy D.-Q. Yang, E. Sacher, Ecole Polytechnique of Montreal, Canada |
AS-MoP5 Thickness Measurement Of Diamond-Like Carbon (DLC) By Auger Electron Spectroscopy (AES) Y. Zheng, B. Lu, Seagate Technology (RMO) Ltd, G. Selvaduray, San Jose State University |
AS-MoP6 Structural Analysis of a DTHXBQ/Pt(dmg)@sub 2@ on KBr Plate used by TRXPS T. Tazawa, Y. Iijima, JEOL Ltd., Japan, S. Isoda, Kyoto University, Japan |
AS-MoP7 Investigation of Pharmaceutical Packaging Materials using XPS and TOF-SIMS X. Dong, R.G. Iacocca, J. Janimak, M.C. Allgeier, Eli Lilly |
AS-MoP8 Determination of Equivalent Circuits of Surface Structures for XPS Analysis O. Tasci, U.K. Demirok, E. Atalar, S. Suzer, Bilkent University, Turkey |
AS-MoP9 Scanning Probe Microscopy and X-ray Photoelectron Spectroscopy Investigations of Focused Ion Beam-Irradiated Targets K. Archuleta, Sandia National Laboratories, J.L. Fenton, University of New Mexico, M.J. Vasile, S. Campin, D.P. Adams, Sandia National Laboratories, J.E. Fulghum, University of New Mexico |
AS-MoP10 The Efficacy of Organosilane Surface Modifications on Distribution of Polar Inorganic Particles within a Nonpolar Polymer Matrix A.K. Wertsching, T.L. Trowbridge, P.J. Pinhero, Idaho National Laboratory |
AS-MoP11 Accurate Force Measurements in the AFM: Improvements in the MEMS Electrical Nanobalance Calibration Device J. Portoles, National Physical Laboratory and University of Nottingham, UK, P.J. Cumpson, National Physical Laboratory, UK, S. Allen, S. Tendler, P. Williams, University of Nottingham, UK |
AS-MoP12 An Investigation of Photoperturbation Effects on Conductive Atomic Force Microscopy M.-N. Chang, C.-Y. Chen, National Nano Device Laboratories, Taiwan |
AS-MoP13 Random Fractal Behavior of InGaAs Quantum Dots Using AFM X. Qian, S.R. Vangala, C. Santeufemio, W.D. Goodhue, University of Massachusetts, Y. Park, Inje University, South Korea |
AS-MoP14 Potential Difference Mapping of Molecules and Particles on Insulating Substrate F. Yamada, T. Matsumoto, H. Tanaka, T. Kawai, Osaka University, Japan |
AS-MoP15 Surface Structure of Thermal Neutron Absorbing Ni-Cr-Mo-Gd Alloys P.J. Pinhero, T.L. Trowbridge, T.E. Lister, R.E. Mizia, Idaho National Laboratory |
AS-MoP16 Information Needed for Improving Sputter Depth Profiling M.H. Engelhard, D.R. Baer, D.J. Gaspar, Pacific Northwest National Laboratory |
AS-MoP17 Effect of Nitrogen on the Preparation of High Quality TiO@sub2-X@N@subX@ Thin Films as a Photocatalyst K. Prabakar, T. Takahashi, T. Nezuka, Toyama University, Japan, T. Nakashima, Kashiwa Chuo High School, Japan, Y. Kubota, Yokohama City University, Japan, A. Fujishima, Kanagawa Academy of Science and Technology, Japan |
AS-MoP18 Sputtering Pressure Dependent Photocatalytic Properties of TiO@sub2@ Thin Films T. Takahashi, K. Prabakar, T. Nezuka, Toyama University, Japan, T. Nakashima, Kashiwa Chuo High School, Japan, Y. Kubota, Yokohama City University, Japan, A. Fujishima, Kanagawa Academy of Science and Technology, Japan |
AS-MoP20 Development of a Plasma Process for Improving Optical and Biocompatible Properties of Contact Lens M. Dhayal, C.H. Kim, C.H. So, Dongshin University, South Korea |
AS-MoP21 UHV Studies of Silicon Carbide Gas Sensors with Catalytic Platinum Gates Y.H. Kahng, R.G. Tobin, Tufts University, R.N. Ghosh, Michigan State University |
AS-MoP22 Electrochemical Spectroscopic Studies of New Materials for PEM Fuel Cells P.C. Wong, D. Susac, L. Zhu, A. Sode, M. Teo, D. Bizzotto, R. Parsons, K.A.R. Mitchell, University of British Columbia, Canada, S.A. Campbell, Ballard Power Systems, Canada |