AVS 52nd International Symposium
    Applied Surface Science Monday Sessions
       Session AS-MoP

Paper AS-MoP8
Determination of Equivalent Circuits of Surface Structures for XPS Analysis

Monday, October 31, 2005, 5:00 pm, Room Exhibit Hall C&D

Session: Aspects of Applied Surface Science Poster Session
Presenter: O. Tasci, Bilkent University, Turkey
Authors: O. Tasci, Bilkent University, Turkey
U.K. Demirok, Bilkent University, Turkey
E. Atalar, Bilkent University, Turkey
S. Suzer, Bilkent University, Turkey
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XPS analysis of non-conducting samples is usually hampered due to charging, and a great deal of effort has been devoted to minimize it. However, it is also possible to utilize this charging to extract information related with dielectric properties of various surface structures. Determination of equivalent circuit(s) and testing on real samples emerge as essential parts of this analysis. To this end, we have carried out a number of experiments to determine the charging/discharging behavior of various surface structures consisting of Au, Ag, and Pt (metallic), Titania (semiconductor), and Silica (dielectric) Nanoparticles deposited on SiO@sub 2@/Si substrates by XPS. We have also constructed the corresponding equivalent circuits by using the PSPICE program and correlated the output with the experimental data. Our experimental results and their correlation with the model(s) will be discussed in detail.