| AVS 50th International Symposium | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-WeP1 A Simple Method Identifying the Influence of Photoperturbation Effect on Ultrashallow Junction Images Observed by Scanning Capacitance Microscope M.-N. Chang, National Nano Device Laboratories, Taiwan, R.O.C., W.-W. Wan, J.-H. Lai, National Tsing Hua University, Taiwan, R.O.C., C.-Y. Chen, F.-M. Pan, National Nano Device Laboratories, Taiwan, R.O.C., J.-H. Liang, National Tsing Hua University, Taiwan, R.O.C. |
| AS-WeP2 Wettability Control of Polymer Surface through 126 nm Vacuum Ultraviolet Light Irradiation Y. Nakanishi, Waseda University, Japan, A. Hozumi, N. Shirahata, National Institute of Advanced Industrial Science and Technology, Japan, S. Asakura, A. Fuwa, Waseda University, Japan |
| AS-WeP3 An XPS Comparison of ALD and PLD Grown Thin Al@sub 2@O@sub 3@ Layers A.I. Zinine, J.M. Sturm, R.G. Bankras, H. Wormeester, B. Poelsema, University of Twente, The Netherlands |
| AS-WeP4 Plasma Etching of (Ba,Sr)TiO@sub 3@ Thin Films for DRAM Applications G.H. Kim, C.I. Kim, D.P. Kim, K.T. Kim, Chung-Ang University, Korea |
| AS-WeP5 Dielectric Properties of Epitaxial Growth (Pb, Sr)TiO@sub 3@ Thin Films on Al@sub 2@ O@sub 3@ (100) Substrate K.T. Kim, C.I. Kim, Chung-Ang University, Korea |
| AS-WeP6 Ferroelectric Properties of Bi @sub 3.25@La @sub 0.75@Ti@sub 3@O@sub 12@ Thin Films on (117)-oriented LaNiO@sub 3@ Electrodes C.I. Kim, K.T. Kim, Chung-Ang University, Korea |
| AS-WeP7 Distinguishing the Dependence of the Apparent Local Barrier Height on Measurement Conditions S. Yagyu, M. Yoshitake, National Institute for Materials Science, Japan, Y. Mizuno, R.E. Kirby, Stanford Linear Accelerator Center |
| AS-WeP8 The Systematic Study of Ga TOF SIMS High Mass Molecular Ion Registration, Composition and Fragmentation of Selected Peptide Hormones on Silver Substrate H Chen, College of William and Mary and Incogen, Inc., A. Wilkerson, College of William and Mary, D. Malyarenko, College of William and Mary and Incogen, Inc., E. Tracy, Applied Research Center and College of William and Mary, D. Manos, Applied Research Center and College of William and Mary. |
| AS-WeP9 Analysis of Silane Coupling Compound Monomolecular layer on Sapphire Glass used by TRXPS T. Tazawa, JEOL Ltd., Japan, C. Mochizuki, M. Shibata, University of Yamanashi, Japan, Y. Iijima, JEOL Ltd., Japan |
| AS-WeP10 Electronic Structure of Carbon Nanotube Filled with Cs Y.J. Song, H. Kim, Seoul National University, Korea, G.-H Jeong, R. Hatakeyama, Tohoku University, Japan, Y. Kuk, Seoul National University, Korea |
| AS-WeP11 Investigation of Secondary Cluster Ion Emission from Self-Assembled Monolayers of Alkanethiols on Gold with TOF-SIMS S. Sohn, M. Schröder, H.F. Arlinghaus, Westfälische Wilhelms-Universität, Germany |
| AS-WeP12 Multivariate Statistical Analysis of Time of Flight Secondary Ion Mass Spectrometry Images, Looking beyond the Obvious V.S. Smentkowski, General Electric Global Research Center, J.A. Ohlhausen, M.R. Keenan, P.G. Kotula, Sandia National Laboratories |
| AS-WeP13 Surface Composition of Polyurethane Foams with Accelerated Aging J. Manzerova, D. Parsons, University of Nevada, Las Vegas, S.W. Yu, Lawrence Berkeley National Laboratory, D.W. Lindle, A.L. Johnson, University of Nevada, Las Vegas |
| AS-WeP14 Field Emission Electron Spectroscopy of Clean and Oxidized Mo <110> Single Tips X. Zhao, R.A. Outlaw, R.L. Champion, D. Manos, B.C. Holloway, The College of William and Mary |
| AS-WeP15 Optical, Structural and Electrical Characteristics of High Dielectric Constant Zirconium Oxide Thin Films Deposited by Spray Pyrolysis M.A. Aguilar, CICATA-IPN, Mexico, G. Reyna, UAM-I, Mexico, M. Garcia, J. Guzman, IIM-UNAM, Mexico, C. Falcony, CINVESTAV-IPN, Mexico |
| AS-WeP16 Using MEMS Microarrays and Neural Networks to Identify Preferred Surface Chemistry in Application-Specific Gas Sensing Z. Boger, R.E. Cavicchi, D.C. Meier, C.B. Montgomery, S. Semancik, National Institute of Standards and Technology |
| AS-WeP17 Nitrogen Doped Carbon Nanoflake Field Emitter Synthesized by RFI PECVD on Patterned Nickel Catalyst Layer M. Zhu, J. Wang, R.A. Outlaw, X. Zhao, N.D. Theodore, College of William and Mary, V.P. Mammana, International Technology Center, B.C. Holloway, D. Manos, College of William and Mary |
| AS-WeP18 Microsensor Technique for Analyte Surface Coverage vs. Sensor Response Correlation A.G. Shirke, R.H. Jackson, B.G. Frederick, The University of Maine, R.E. Cavicchi, S. Semancik, National Institute of Standards and Technology, M.C. Wheeler, The University of Maine |
| AS-WeP19 High Spatial Resolution XPS Analysis of Si Samples Prepared using the FIB Lift-out Technique J. Fenton, J.E. Fulghum, University of New Mexico, L.A. Giannuzzi, FEI Company, F.A. Stevie, North Carolina State University |
| AS-WeP20 Ion Beam Alignment of Liquid Crystals on Polymer Substrates S. Pylypenko, K. Artyushkova, J.E. Fulghum, University of New Mexico, L. Su, L. West, Kent State University, Y. Reznikov, Ukraine Academy of Science |
| AS-WeP21 Relation between RF Breakdown and Particles Contamination on RF-Processed X-band Structures F. Le Pimpec, S. Harvey, R.E. Kirby, F. Marcelja, SLAC |